Inventor · disambiguated record
Itzik Goldberger
Also filed as: GOLDBERGER ITZIK
1 granted patent·2 pending applications·79 citations·filing 2002–2006
52Inventor score
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3 records- 0191US6859031B2Apparatus and method for dynamic diagnostic testing of integrated circuitsCREDENCE SYSTEMS CORP·Filed 2002·Granted Feb 22, 2005·79 cites·19 claims
- 0233US2007111340A1Method for in-line testing of semiconductor wafersCREDENCE SYSTEMS CORP·Filed 2006·Application pending·0 cites
- 0333US2006103378A1Apparatus and method for dynamic diagnostic testing of integrated circuitsPAKDAMAN NADER·Filed 2004·Application pending·0 cites
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