Inventor · disambiguated record

Yoshiyuki Nag'No

Also filed as: NAG NO YOSHIYUKI

1 granted patent·5 citations·filing 2004–2004

27Inventor score

Technology areasG01Q

Files withHITACHI KENKI FINE TECH CO LTD1

Top patents by PatentIndex Score

1 record

0146US7388199B2Probe manufacturing method, probe, and scanning probe microscopeHITACHI KENKI FINE TECH CO LTD·Filed 2004·Granted Jun 17, 2008·5 cites·17 claims

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