Inventor · disambiguated record

Wei-Jhe Tzai

Also filed as: TZAI WEI-JHE

1 granted patent·5 citations·filing 2013–2013

26Inventor score

Technology areasG03F

Files withUNITED MICROELECTRONICS CORP1

Top patents by PatentIndex Score

1 record

0184US9007571B2Measurement method of overlay markUNITED MICROELECTRONICS CORP·Filed 2013·Granted Apr 14, 2015·5 cites·19 claims

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