Inventor · disambiguated record

Tetsuya Sakaniwa

Also filed as: SAKANIWA TETSUYA

1 granted patent·0 citations·filing 2007–2007

4Inventor score

Technology areasG11C

Files withADVANTEST CORP1

Top patents by PatentIndex Score

1 record

0131US8014969B2Test apparatus, test method and manufacturing methodADVANTEST CORP·Filed 2007·Granted Sep 6, 2011·0 cites·9 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →