Inventor · disambiguated record
Arnold Cheng
Also filed as: CHENG ARNOLD
2 granted patents·64 citations·filing 1997–2001
65Inventor score
Technology areasG01N
Files withINSPEX INC2
Top patents by PatentIndex Score
2 records- 0175US6643006B1Method and system for reviewing a semiconductor wafer using at least one defect sampling conditionINSPEX INC·Filed 2001·Granted Nov 4, 2003·18 cites·28 claims
- 0272US6028664AMethod and system for establishing a common reference point on a semiconductor wafer inspected by two or more scanning mechanismsINSPEX INC·Filed 1997·Granted Feb 22, 2000·46 cites·11 claims
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