Inventor · disambiguated record

Ryouji Nishihashi

Also filed as: NISHIHASHI RYOUJI

2 granted patents·24 citations·filing 1988–2003

60Inventor score

Technology areasG01R H10P

Files withMITSUBISHI ELECTRIC CORP1 RENESAS TECH CORP1

Top patents by PatentIndex Score

2 records

0160US6972202B2Method of manufacturing and testing a semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Dec 6, 2005·9 cites·3 claims
0252US4904934ATesting apparatus for semiconductor devicesMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Feb 27, 1990·15 cites·13 claims

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