Inventor · disambiguated record

Jong-Koo Kil

Also filed as: KIL JONG-KOO

1 granted patent·1 pending application·0 citations·filing 2012–2014

7Inventor score

Technology areasG01R H10P

Files withKIL JONG-KOO1 SAMSUNG ELECTRONICS CO LTD1

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2 records

0146US9696369B2Wafer test apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jul 4, 2017·0 cites·17 claims
0214US2013075059A1Apparatus for controlling a temperature of a loading chuck and methods of operating the sameKIL JONG-KOO·Filed 2012·Application pending·0 cites

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