Inventor · disambiguated record
Ilyoung Kim
Also filed as: KIM ILYOUNG · KIM ILYOUNG I
19 granted patents·3 pending applications·451 citations·filing 1987–2025
95Inventor score
Files withLUCENT TECHNOLOGIES INC6SAMSUNG ELECTRONICS CO LTD5AGERE SYST GUARDIAN CORP3AT & T CORP2EVANS DONALD A2
Top patents by PatentIndex Score
22 records- 0189US7254763B2Built-in self test for memory arrays using error correction codingAGERE SYSTEMS INC·Filed 2004·Granted Aug 7, 2007·68 cites·34 claims
- 0288US6216241B1Method and system for testing multiport memoriesAGERE SYST GUARDIAN CORP·Filed 1998·Granted Apr 10, 2001·74 cites·19 claims
- 0388US5040228AMethod and apparatus for automatically focusing an image-acquisition deviceAT & T BELL LAB·Filed 1989·Granted Aug 13, 1991·68 cites·4 claims
- 0485US6205564B1Optimized built-in self-test method and apparatus for random access memoriesLUCENT TECHNOLOGIES INC·Filed 1997·Granted Mar 20, 2001·65 cites·37 claims
- 0584US11445098B2Camera assembly and electronic device including sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Sep 13, 2022·2 cites·20 claims
- 0676US6397349B2Built-in self-test and self-repair methods and devices for computer memories comprising a reconfiguration memory deviceAGERE SYST GUARDIAN CORP·Filed 1998·Granted May 28, 2002·39 cites·16 claims
- 0767US5978935AMethod for built-in self-testing of ring-address FIFOs having a data input register with transparent latchesLUCENT TECHNOLOGIES INC·Filed 1997·Granted Nov 2, 1999·27 cites·20 claims
- 0866US6317846B1System and method for detecting faults in computer memories using a look up tableAGERE SYST GUARDIAN CORP·Filed 1998·Granted Nov 13, 2001·24 cites·13 claims
- 0961US5978947ABuilt-in self-test in a plurality of stages controlled by a token passing network and methodLUCENT TECHNOLOGIES INC·Filed 1997·Granted Nov 2, 1999·23 cites·28 claims
- 1054US2025220838A1Electronic device including molding partSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1153US2024167156A1Fluidic baffle for high pressure fluid distribution and substrate processing apparatusSEMES CO LTD·Filed 2023·Application pending·0 cites
- 1251US8201032B2Generalized BIST for multiport memoriesEVANS DONALD A·Filed 2007·Granted Jun 12, 2012·2 cites·23 claims
- 1350US6108802ATesting method and apparatus for first-in first-out memoriesLUCENT TECHNOLOGIES INC·Filed 1998·Granted Aug 22, 2000·13 cites·28 claims
- 1448US12360221B2Electronic device and method for compensating for depth error according to modulation frequencySAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Jul 15, 2025·0 cites·20 claims
- 1548US11852752B2Cross-talk prevention structure of electronic device for measuring distance to external objectSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Dec 26, 2023·0 cites·13 claims
- 1643US6237123B1Built-in self-test controlled by a token network and methodLUCENT TECHNOLOGIES INC·Filed 1997·Granted May 22, 2001·17 cites·9 claims
- 1742US11216070B2Electronic device and method for controlling actuator by utilizing sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jan 4, 2022·0 cites·15 claims
- 1841US5420870ANon-fully-decoded test address generatorAT & T CORP·Filed 1994·Granted May 30, 1995·8 cites·5 claims
- 1940US6175936B1Apparatus for detecting faults in multiple computer memoriesLUCENT TECHNOLOGIES INC·Filed 1998·Granted Jan 16, 2001·7 cites·16 claims
- 2037US5473651AMethod and apparatus for testing large embedded countersAT & T CORP·Filed 1994·Granted Dec 5, 1995·11 cites·23 claims
- 2134US4795920AMethod and apparatus for sourcing and sinking currentAMERICAN TELEPHONE & TELEGRAPH·Filed 1987·Granted Jan 3, 1989·3 cites·7 claims
- 2233US2006090106A1Generalized BIST for multiport memoriesEVANS DONALD A·Filed 2004·Application pending·0 cites
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