Inventor · disambiguated record
Jun-Lin Yeh
Also filed as: YEH JUN-LIN
21 granted patents·1 pending application·989 citations·filing 1997–2021
94Inventor score
Files withWINBOND ELECTRONICS CORP13TAIWAN SEMICONDUCTOR MFG CO LTD4CHEN CHIEN HAO2CHANG CHUN-LIN1LIN CHI-CHENG1
Top patents by PatentIndex Score
22 records- 0198US9425126B2Dummy structure for chip-on-wafer-on-substrateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Aug 23, 2016·883 cites·20 claims
- 0294US8404572B2Multi-zone temperature control for semiconductor waferCHANG CHUN-LIN·Filed 2009·Granted Mar 26, 2013·40 cites·20 claims
- 0390US10113233B2Multi-zone temperature control for semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 30, 2018·6 cites·14 claims
- 0487US8450161B2Method of fabricating a sealing structure for high-k metal gateCHEN CHIEN-HAO·Filed 2012·Granted May 28, 2013·9 cites·20 claims
- 0581US9754831B2Dummy structure for chip-on-wafer-on-substrateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Sep 5, 2017·3 cites·20 claims
- 0680US9023664B2Multi-zone temperature control for semiconductor waferTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 5, 2015·3 cites·11 claims
- 0780US8193586B2Sealing structure for high-K metal gateCHEN CHIEN-HAO·Filed 2009·Granted Jun 5, 2012·8 cites·20 claims
- 0872US9214495B1Memory cell structure and formation method thereofWINBOND ELECTRONICS CORP·Filed 2014·Granted Dec 15, 2015·2 cites·18 claims
- 0969US7203107B2Device and method for compensating defect in semiconductor memoryWINBOND ELECTRONICS CORP·Filed 2005·Granted Apr 10, 2007·6 cites·12 claims
- 1068US10249376B2Flash memory storage device and operating method thereofWINBOND ELECTRONICS CORP·Filed 2018·Granted Apr 2, 2019·2 cites·20 claims
- 1166US8885383B1Flash memory and layout method thereofWINBOND ELECTRONICS CORP·Filed 2013·Granted Nov 11, 2014·2 cites·11 claims
- 1255US9136008B1Flash memory apparatus and data reading method thereofWINBOND ELECTRONICS CORP·Filed 2014·Granted Sep 15, 2015·1 cites·8 claims
- 1355US5862073AFloating gate memory array device with improved program and read performanceWINBOND ELECTRONICS CORP·Filed 1997·Granted Jan 19, 1999·17 cites·10 claims
- 1447US9104401B2Flash memory apparatus with serial interface and reset method thereofWINBOND ELECTRONICS CORP·Filed 2014·Granted Aug 11, 2015·0 cites·3 claims
- 1546US7020003B2Device and method for compensating defect in semiconductor memoryWINBOND ELECTRONICS CORP·Filed 2004·Granted Mar 28, 2006·4 cites·12 claims
- 1643US11682470B2Memory device and operating method thereofWINBOND ELECTRONICS CORP·Filed 2021·Granted Jun 20, 2023·0 cites·20 claims
- 1740US10566060B2Memory device and program/erase method thereforWINBOND ELECTRONICS CORP·Filed 2018·Granted Feb 18, 2020·0 cites·16 claims
- 1837US10762970B2Inspection method for memory integrity, nonvolatile memory and electronic deviceWINBOND ELECTRONICS CORP·Filed 2018·Granted Sep 1, 2020·0 cites·20 claims
- 1937US9281020B2Storage medium and accessing system utilizing the sameWINBOND ELECTRONICS CORP·Filed 2012·Granted Mar 8, 2016·0 cites·17 claims
- 2037US2012246384A1Flash memory and flash memory accessing methodLIN CHI-CHENG·Filed 2011·Application pending·0 cites
- 2136US8914569B2Flash memory apparatus with serial interface and reset method thereofYEH JUN-LIN·Filed 2011·Granted Dec 16, 2014·0 cites·8 claims
- 2233US6147529AVoltage sensing circuitWINBOND ELECTRONICS CORP·Filed 1998·Granted Nov 14, 2000·3 cites·12 claims
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