Inventor · disambiguated record
Atsuo Mangyo
Also filed as: MANGYO ATSUO
8 granted patents·1 pending application·134 citations·filing 1998–2019
87Inventor score
Files withRENESAS TECH CORP5MITSUBISHI ELECTRIC CORP1SONY COMPUTER ENTERTAINMENT INC1SONY SEMICONDUCTOR SOLUTIONS CORP1
Top patents by PatentIndex Score
9 records- 0186US5991232AClock synchronous memory embedded semiconductor integrated circuit deviceMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Nov 23, 1999·68 cites·18 claims
- 0279US7676683B2Method and system for rebooting a processor in a multi-processor systemSONY COMPUTER ENTERTAINMENT INC·Filed 2006·Granted Mar 9, 2010·13 cites·16 claims
- 0372US7237175B2Memory circuitRENESAS TECH CORP·Filed 2002·Granted Jun 26, 2007·18 cites·3 claims
- 0464US6807116B2Semiconductor circuit device capable of accurately testing embedded memoryRENESAS TECH CORP·Filed 2003·Granted Oct 19, 2004·13 cites·12 claims
- 0562US7047461B2Semiconductor integrated circuit device with test data output nodes for parallel test results outputRENESAS TECH CORP·Filed 2002·Granted May 16, 2006·12 cites·9 claims
- 0649US6715117B2Method of testing a semiconductor memory deviceRENESAS TECH CORP·Filed 2001·Granted Mar 30, 2004·6 cites·12 claims
- 0744US11887642B2Storage control device, storage device, and information processing systemSONY SEMICONDUCTOR SOLUTIONS CORP·Filed 2019·Granted Jan 30, 2024·0 cites·14 claims
- 0844US6781903B2Semiconductor memory device with power consumption reduced in non-data-accessRENESAS TECH CORP·Filed 2003·Granted Aug 24, 2004·4 cites·9 claims
- 0930US2002162060A1Integrated circuit facilitating its unit testFiled 2001·Application pending·0 cites
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