P

Inventor

CHAU ROBERT

US73 patents
⚠️ This page may combine multiple inventors who share the name “CHAU ROBERT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

44 patents
US7662689B2Feb 16, 2010

Strained transistor integration for CMOS

INTEL CORP343 citations99
US7348284B2Mar 25, 2008

Non-planar pMOS structure with a strained channel region and an integrated strained CMOS flow

INTEL CORP141 citations99
US7268058B2Sep 11, 2007

Tri-gate transistors and methods to fabricate same

INTEL CORP164 citations99
US6897098B2May 24, 2005

Method of fabricating an ultra-narrow channel semiconductor device

INTEL CORP226 citations99
US6696345B2Feb 24, 2004

Metal-gate electrode for CMOS transistor applications

INTEL CORP164 citations99
US6617209B1Sep 9, 2003

Method for making a semiconductor device having a high-k gate dielectric

INTEL CORP132 citations99
US7531393B2May 12, 2009

Non-planar MOS structure with a strained channel region

INTEL CORP121 citations98
US7494862B2Feb 24, 2009

Methods for uniform doping of non-planar transistor structures

INTEL CORP70 citations98
US7193279B2Mar 20, 2007

Non-planar MOS structure with a strained channel region

INTEL CORP76 citations98
US6974733B2Dec 13, 2005

Double-gate transistor with enhanced carrier mobility

INTEL CORP95 citations98
US6890807B2May 10, 2005

Method for making a semiconductor device having a metal gate electrode

INTEL CORP67 citations98
US6620713B2Sep 16, 2003

Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication

INTEL CORP80 citations98
US6617210B1Sep 9, 2003

Method for making a semiconductor device having a high-k gate dielectric

INTEL CORP127 citations98
US7071064B2Jul 4, 2006

U-gate transistors and methods of fabrication

INTEL CORP96 citations97
US7223679B2May 29, 2007

Transistor gate electrode having conductor material layer

INTEL CORP34 citations96
US6900481B2May 31, 2005

Non-silicon semiconductor and high-k gate dielectric metal oxide semiconductor field effect transistors

INTEL CORP64 citations96
US6610615B1Aug 26, 2003

Plasma nitridation for reduced leakage gate dielectric layers

INTEL CORP127 citations96
US7968957B2Jun 28, 2011

Transistor gate electrode having conductor material layer

INTEL CORP11 citations93
US7851790B2Dec 14, 2010

Isolated Germanium nanowire on Silicon fin

INTEL CORP43 citations93
US7473947B2Jan 6, 2009

Process for ultra-thin body SOI devices that incorporate EPI silicon tips and article made thereby

INTEL CORP20 citations93
US7145246B2Dec 5, 2006

Method of fabricating an ultra-narrow channel semiconductor device

INTEL CORP32 citations93
US7045073B2May 16, 2006

Pre-etch implantation damage for the removal of thin film layers

INTEL CORP22 citations93
US6998686B2Feb 14, 2006

Metal-gate electrode for CMOS transistor applications

INTEL CORP23 citations93
US7960794B2Jun 14, 2011

Non-planar pMOS structure with a strained channel region and an integrated strained CMOS flow

INTEL CORP20 citations92
US5488003AJan 30, 1996

Method of making emitter trench BiCMOS using integrated dual layer emitter mask

INTEL CORP26 citations92
US6667251B2Dec 23, 2003

Plasma nitridation for reduced leakage gate dielectric layers

INTEL CORP29 citations90
US10541305B2Jan 21, 2020

Group III-N nanowire transistors

INTEL CORP4 citations84
US10186581B2Jan 22, 2019

Group III-N nanowire transistors

INTEL CORP4 citations84
US9666492B2May 30, 2017

CMOS implementation of germanium and III-V nanowires and nanoribbons in gate-all-around architecture

INTEL CORP6 citations84
US9397188B2Jul 19, 2016

Group III-N nanowire transistors

INTEL CORP7 citations84
US8872225B2Oct 28, 2014

Defect transferred and lattice mismatched epitaxial film

INTEL CORP12 citations84
US7936025B2May 3, 2011

Metalgate electrode for PMOS transistor

INTEL CORP13 citations84
US7608883B2Oct 27, 2009

Transistor for non volatile memory devices having a carbon nanotube channel and electrically floating quantum dots in its gate dielectric

INTEL CORP13 citations84
US7422971B2Sep 9, 2008

Process for ultra-thin body SOI devices that incorporate EPI silicon tips and article made thereby

INTEL CORP10 citations84
US7342277B2Mar 11, 2008

Transistor for non volatile memory devices having a carbon nanotube channel and electrically floating quantum dots in its gate dielectric

INTEL CORP13 citations84
US7166505B2Jan 23, 2007

Method for making a semiconductor device having a high-k gate dielectric

INTEL CORP11 citations84
US7566898B2Jul 28, 2009

Buffer architecture formed on a semiconductor wafer

INTEL CORP17 citations83
US7531404B2May 12, 2009

Semiconductor device having a metal gate electrode formed on an annealed high-k gate dielectric layer

INTEL CORP16 citations83
US9029835B2May 12, 2015

Epitaxial film on nanoscale structure

INTEL CORP13 citations82
US7671414B2Mar 2, 2010

Semiconductor on insulator apparatus

INTEL CORP5 citations74
US7642610B2Jan 5, 2010

Transistor gate electrode having conductor material layer

INTEL CORP7 citations74
US7427538B2Sep 23, 2008

Semiconductor on insulator apparatus and method

INTEL CORP5 citations74
US6809017B2Oct 26, 2004

Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication

INTEL CORP8 citations74
US10784170B2Sep 22, 2020

CMOS implementation of germanium and III-V nanowires and nanoribbons in gate-all-around architecture

INTEL CORP3 citations73

THEN HAN WUI

3 patents

RADOSAVLJEVIC MARKO

1 patent

RACHMADY WILLY

1 patent

PILLARISETTY RAVI

1 patent

Showing the top 50 of 73 patents by PatentIndex Score.