Inventor · disambiguated record
Satoshi Akutagawa
Also filed as: AKUTAGAWA SATOSHI
8 granted patents·2 pending applications·61 citations·filing 1989–2014
86Inventor score
Top patents by PatentIndex Score
10 records- 0171US7466405B2Pattern inspection method, pattern inspection system and pattern inspection program of photomaskFUJITSU LTD·Filed 2005·Granted Dec 16, 2008·3 cites·20 claims
- 0254US6807654B2Method of and device for detecting pattern, method of and device for checking pattern, method of and device for correcting and processing pattern, and computer productFUJITSU LTD·Filed 2002·Granted Oct 19, 2004·5 cites·20 claims
- 0353US5287290AMethod and apparatus for checking a mask patternFUJITSU LTD·Filed 1992·Granted Feb 15, 1994·23 cites·5 claims
- 0445US6413688B2Plate pattern forming method and its inspecting methodFUJITSU LTD·Filed 2001·Granted Jul 2, 2002·5 cites·21 claims
- 0545US2016289401A1Article including polymer having surface with low coefficient of friction and manufacturing method of such3M INNOVATIIVE PROPERTIES COMPANY·Filed 2014·Application pending·0 cites
- 0636US5936642AParallel graphic processing system using a networkSHINKO ELECTRIC IND CO·Filed 1997·Granted Aug 10, 1999·10 cites·4 claims
- 0735US2013250426A1Microlens sheet and manufacturing method thereofHATTORI JIRO·Filed 2011·Application pending·0 cites
- 0832US4967229AProcess for forming dicing lines on waferFUJITSU LTD·Filed 1989·Granted Oct 30, 1990·5 cites·3 claims
- 0931US6008822AParallel graphic processing system using a networkSHINKO ELECTRIC IND CO·Filed 1999·Granted Dec 28, 1999·5 cites·4 claims
- 1025US5889531AGraphic processing apparatusSHINKO ELECTRIC IND CO·Filed 1997·Granted Mar 30, 1999·5 cites·4 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →