Inventor · disambiguated record
Akira Goishi
Also filed as: GOISHI AKIRA
6 granted patents·154 citations·filing 1994–1996
86Inventor score
Technology areasG01R
Files withADVANTEST CORP6
Top patents by PatentIndex Score
6 records- 0183US5640539AIC analysis system having charged particle beam apparatus for improved contrast imageADVANTEST CORP·Filed 1994·Granted Jun 17, 1997·58 cites·9 claims
- 0271US5528156AIC analysis system and electron beam probe system and fault isolation method thereforADVANTEST CORP·Filed 1994·Granted Jun 18, 1996·27 cites·4 claims
- 0364US5640098AIC fault analysis system having charged particle beam testerADVANTEST CORP·Filed 1996·Granted Jun 17, 1997·27 cites·6 claims
- 0454US5592099AIC tester joined with ion beam tester and the detection method of the failure part of ICADVANTEST CORP·Filed 1995·Granted Jan 7, 1997·20 cites·5 claims
- 0549US5589780AIC Analysis system and electron beam probe system and fault isolation method thereforADVANTEST CORP·Filed 1994·Granted Dec 31, 1996·11 cites·8 claims
- 0647US5633595AIC analysis system and electron beam probe system and fault isolation method thereforADVANTEST CORP·Filed 1995·Granted May 27, 1997·11 cites·2 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →