Inventor · disambiguated record
Masayuki Kuribara
Also filed as: KURIBARA MASAYUKI
10 granted patents·1 pending application·81 citations·filing 1994–2009
87Inventor score
Top patents by PatentIndex Score
11 records- 0171US5528156AIC analysis system and electron beam probe system and fault isolation method thereforADVANTEST CORP·Filed 1994·Granted Jun 18, 1996·27 cites·4 claims
- 0265US7560693B2Electron-beam size measuring apparatus and size measuring method with electron beamsADVANTEST CORP·Filed 2007·Granted Jul 14, 2009·2 cites·12 claims
- 0359US7663103B2Line-width measurement adjusting method and scanning electron microscopeADVANTEST CORP·Filed 2007·Granted Feb 16, 2010·3 cites·9 claims
- 0454US5592099AIC tester joined with ion beam tester and the detection method of the failure part of ICADVANTEST CORP·Filed 1995·Granted Jan 7, 1997·20 cites·5 claims
- 0549US5589780AIC Analysis system and electron beam probe system and fault isolation method thereforADVANTEST CORP·Filed 1994·Granted Dec 31, 1996·11 cites·8 claims
- 0647US5633595AIC analysis system and electron beam probe system and fault isolation method thereforADVANTEST CORP·Filed 1995·Granted May 27, 1997·11 cites·2 claims
- 0745US8530836B2Electron-beam dimension measuring apparatus and electron-beam dimension measuring methodKURIBARA MASAYUKI·Filed 2009·Granted Sep 10, 2013·0 cites·10 claims
- 0841US7262410B2Sample observing apparatus and sample observing methodADVANTEST CORP·Filed 2005·Granted Aug 28, 2007·0 cites·9 claims
- 0936US6326798B1Electric beam tester and image processing apparatusADVANTEST CORP·Filed 1999·Granted Dec 4, 2001·7 cites·16 claims
- 1036US2003106425A1Swash plate-type compressorFiled 2002·Application pending·0 cites
- 1134US6445197B1Electron beam tester, recording medium therefor and signal data detecting methodADVANTEST CORP·Filed 2000·Granted Sep 3, 2002·0 cites·15 claims
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