Inventor · disambiguated record
Dimitra Gkorou
Also filed as: GKOROU DIMITRA
6 granted patents·5 pending applications·3 citations·filing 2017–2023
68Inventor score
Files withASML NETHERLANDS BV11
Top patents by PatentIndex Score
11 records- 0180US11099486B2Generating predicted data for control or monitoring of a production processASML NETHERLANDS BV·Filed 2017·Granted Aug 24, 2021·3 cites·21 claims
- 0269US11520238B2Optimizing an apparatus for multi-stage processing of product unitsASML NETHERLANDS BV·Filed 2021·Granted Dec 6, 2022·0 cites·20 claims
- 0356US11579534B2Extracting a feature from a data setASML NETHERLANDS BV·Filed 2020·Granted Feb 14, 2023·0 cites·20 claims
- 0456US11150562B2Optimizing an apparatus for multi-stage processing of product unitsASML NETHERLANDS BV·Filed 2018·Granted Oct 19, 2021·0 cites·20 claims
- 0555US2025029014A1Identifying deviating modules from a reference population for machine diagnosticsASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0653US11740560B2Method for determining an inspection strategy for a group of substrates in a semiconductor manufacturing processASML NETHERLANDS BV·Filed 2021·Granted Aug 29, 2023·0 cites·20 claims
- 0752US2024273278A1Computer implemented method for diagnosing a system comprising a plurality of modulesASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0850US2025117921A1Active learning to improve wafer defect classificationASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0946US12353967B2Method and apparatus for determining feature contribution to performanceASML NETHERLANDS BV·Filed 2020·Granted Jul 8, 2025·0 cites·20 claims
- 1044US2023153582A1Configuration of an imputer modelASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 1142US2023316103A1Method for classifying semiconductor wafersASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →