Inventor · disambiguated record
Mark Windoloski
Also filed as: WINDOLOSKI MARK · WINDOLOSKI MARK D
13 granted patents·10 pending applications·215 citations·filing 2002–2023
91Inventor score
Top patents by PatentIndex Score
23 records- 0197US6784662B2Eddy current sensor arrays having drive windings with extended portionsJENTEK SENSORS INC·Filed 2002·Granted Aug 31, 2004·94 cites·49 claims
- 0289US7049811B2Test circuit having parallel drive segments and a plurality of sense elementsJENTEK SENSORS INC·Filed 2004·Granted May 23, 2006·28 cites·28 claims
- 0388US7451639B2Engine blade dovetail inspectionJENTEK SENSORS INC·Filed 2007·Granted Nov 18, 2008·18 cites·23 claims
- 0487US7696748B2Absolute property measurements using electromagnetic sensorsJENTEK SENSORS INC·Filed 2004·Granted Apr 13, 2010·31 cites·18 claims
- 0587US7289913B2Local feature characterization using quasistatic electromagnetic sensorsJENTEK SENSORS INC·Filed 2005·Granted Oct 30, 2007·11 cites·14 claims
- 0686US7518360B2Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2007·Granted Apr 14, 2009·11 cites·30 claims
- 0784US7188532B2Self-monitoring metals, alloys and materialsJENTEK SENSORS INC·Filed 2004·Granted Mar 13, 2007·20 cites·13 claims
- 0879US12359945B2Measurement system and method of useJENTEK SENSORS INC·Filed 2023·Granted Jul 15, 2025·0 cites·20 claims
- 0976US11841245B2Measurement system and method of useJENTEK SENSORS INC·Filed 2023·Granted Dec 12, 2023·0 cites·18 claims
- 1074US2022412918A1Complex part inspection with eddy current sensorsJENTEK SENSORS INC·Filed 2022·Application pending·0 cites
- 1171US7812601B2Material condition assessment with eddy current sensorsJENTEK SENSORS INC·Filed 2009·Granted Oct 12, 2010·2 cites·18 claims
- 1267US11549831B2Measurement system and method of useJENTEK SENSORS INC·Filed 2019·Granted Jan 10, 2023·0 cites·18 claims
- 1361US12332201B2System and method for pit detection and sizingJENTEK SENSORS INC·Filed 2022·Granted Jun 17, 2025·0 cites·20 claims
- 1454US10416118B1Measurement system and method of useJENTEK SENSORS INC·Filed 2017·Granted Sep 17, 2019·0 cites·9 claims
- 1554US2006186880A1Automated drawing tool and method for drawing a sensor layoutSCHLICKER DARRELL E·Filed 2006·Application pending·0 cites
- 1653US2007227255A1Self-monitoring metals, alloys and materialsGOLDFINE NEIL J·Filed 2007·Application pending·0 cites
- 1752US2006244443A1Material condition assessment with eddy current sensorsGOLDFINE NEIL J·Filed 2006·Application pending·0 cites
- 1851US2005007106A1Hybrid wound/etched winding constructs for scanning and monitoringJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
- 1945US2004004475A1High throughput absolute flaw imagingJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 2045US2003164700A1High resolution hidden damage imagingJENTEK SENSORS INC·Filed 2003·Application pending·0 cites
- 2144US2007069720A1Material characterization with model based sensorsGOLDFINE NEIL J·Filed 2005·Application pending·0 cites
- 2243US2006076952A9Segmented field sensorsJENTEK SENSORS INC·Filed 2005·Application pending·0 cites
- 2340US2005017713A1Weld characterization using eddy current sensors and arraysJENTEK SENSORS INC·Filed 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →