Inventor · disambiguated record
Stuart D Chaplan
Also filed as: CHAPLAN STUART · CHAPLAN STUART D
8 granted patents·1 pending application·9 citations·filing 2017–2024
78Inventor score
Files withJENTEK SENSORS INC9
Top patents by PatentIndex Score
9 records- 0181US2025044257A1System and method for hole inspectionJENTEK SENSORS INC·Filed 2024·Application pending·0 cites
- 0279US12359945B2Measurement system and method of useJENTEK SENSORS INC·Filed 2023·Granted Jul 15, 2025·0 cites·20 claims
- 0377US12061169B2System and method for hole inspectionJENTEK SENSORS INC·Filed 2022·Granted Aug 13, 2024·0 cites·20 claims
- 0476US11841245B2Measurement system and method of useJENTEK SENSORS INC·Filed 2023·Granted Dec 12, 2023·0 cites·18 claims
- 0567US11549831B2Measurement system and method of useJENTEK SENSORS INC·Filed 2019·Granted Jan 10, 2023·0 cites·18 claims
- 0661USD830863SPortable test instrumentJENTEK SENSORS INC·Filed 2017·Granted Oct 16, 2018·7 cites·1 claims
- 0754US10416118B1Measurement system and method of useJENTEK SENSORS INC·Filed 2017·Granted Sep 17, 2019·0 cites·9 claims
- 0853US12461068B2System and method for hole inspection and qualificationJENTEK SENSORS INC·Filed 2022·Granted Nov 4, 2025·0 cites·1 claims
- 0941USD857534SPortable test instrumentJENTEK SENSORS INC·Filed 2018·Granted Aug 27, 2019·2 cites·1 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →