Inventor · disambiguated record
Menachem Regensburger
Also filed as: REGENSBURGER MENACHEM
15 granted patents·4 pending applications·16 citations·filing 2006–2025
87Inventor score
Top patents by PatentIndex Score
19 records- 0191US11828713B1Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2022·Granted Nov 28, 2023·4 cites·15 claims
- 0276US9756313B2High throughput and low cost height triangulation system and methodCAMTEK LTD·Filed 2014·Granted Sep 5, 2017·4 cites·32 claims
- 0376US2025290869A1Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2025·Application pending·0 cites
- 0474US12320757B2Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2023·Granted Jun 3, 2025·0 cites·31 claims
- 0573US10497092B2Continuous light inspectionCAMTEK LTD·Filed 2016·Granted Dec 3, 2019·2 cites·22 claims
- 0664US8238645B2Inspection system and a method for detecting defects based upon a reference framePOSTOLOV YURI·Filed 2006·Granted Aug 7, 2012·2 cites·18 claims
- 0764US2022214287A1Automatic defect classificationCAMTEK LTD·Filed 2022·Application pending·0 cites
- 0858US8233699B2Inspection system and a method for detecting defects based upon a reference framePOSTOLOV YURI·Filed 2006·Granted Jul 31, 2012·1 cites·8 claims
- 0953US8699784B2Inspection recipe generation and inspection based on an inspection recipeLANGMATZ ELDAD·Filed 2011·Granted Apr 15, 2014·2 cites·33 claims
- 1052US11300521B2Automatic defect classificationCAMTEK LTD·Filed 2018·Granted Apr 12, 2022·0 cites·23 claims
- 1148US10203289B2Inspection system and a method for inspecting a diced waferPOSTOLOV YURI·Filed 2006·Granted Feb 12, 2019·0 cites·36 claims
- 1245US8089058B2Method for establishing a wafer testing recipeREGENSBURGER MENACHEM·Filed 2006·Granted Jan 3, 2012·1 cites·6 claims
- 1343US10732128B2Hierarchical wafer inspectionCAMTEK LTD·Filed 2018·Granted Aug 4, 2020·0 cites·21 claims
- 1441US2010194877A1Method and system for imaging an electrical circuitREGENSBURGER MENACHEM·Filed 2008·Application pending·0 cites
- 1540US8208713B2Method and system for inspecting a diced waferPOSTOLOV YURI·Filed 2009·Granted Jun 26, 2012·0 cites·19 claims
- 1636US10598607B2Objective lensCAMTEK LTD·Filed 2018·Granted Mar 24, 2020·0 cites·23 claims
- 1735US10042974B2Inspecting a wafer using image and design informationPOSTOLOV YURI·Filed 2017·Granted Aug 7, 2018·0 cites·19 claims
- 1835US2011164129A1Method and a system for creating a reference image using unknown quality patternsCAMTEK LTD·Filed 2006·Application pending·0 cites
- 1933US8290243B2System and method for inspectionLEV MICHAEL·Filed 2010·Granted Oct 16, 2012·0 cites·17 claims
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