Inventor · disambiguated record

Te-Hsun Fu

Also filed as: Fu Te-Hsun

2 granted patents·0 citations·filing 2015–2019

22Inventor score

Technology areasG06F

Files withGLOBAL UNICHIP CORP1 GLOBAL UNICHIP NANJING LTD1

Top patents by PatentIndex Score

2 records

0143US10776558B2Testing system and testing methodGLOBAL UNICHIP NANJING LTD·Filed 2019·Granted Sep 15, 2020·0 cites·10 claims
0230US9710580B2Timing analysis method for digital circuit design and system thereofGLOBAL UNICHIP CORP·Filed 2015·Granted Jul 18, 2017·0 cites·15 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →