Inventor · disambiguated record
Vikram Iyengar
Also filed as: IYENGAR VIKRAM · IYENGAR VIKRAM N · IYENGAR VIKRAM NANDAKUMAR
26 granted patents·8 pending applications·152 citations·filing 2006–2024
95Inventor score
Top patents by PatentIndex Score
34 records- 0194US9104834B2Systems and methods for single cell product path delay analysisIBM·Filed 2014·Granted Aug 11, 2015·20 cites·17 claims
- 0293US8539429B1System yield optimization using the results of integrated circuit chip performance path testingBICKFORD JEANNE P·Filed 2012·Granted Sep 17, 2013·11 cites·20 claims
- 0393US7620921B2IC chip at-functional-speed testing with process coverage evaluationIBM·Filed 2007·Granted Nov 17, 2009·33 cites·30 claims
- 0489US8543966B2Test path selection and test program generation for performance testing integrated circuit chipsBICKFORD JEANNE P·Filed 2011·Granted Sep 24, 2013·8 cites·24 claims
- 0582US9058034B2Integrated circuit product yield optimization using the results of performance path testingBICKFORD JEANNE P·Filed 2012·Granted Jun 16, 2015·5 cites·20 claims
- 0682US7996807B2Integrated test waveform generator (TWG) and customer waveform generator (CWG), design structure and methodIBM·Filed 2008·Granted Aug 9, 2011·11 cites·20 claims
- 0779US10424821B2Thermally regulated modular energy storage device and methodsYOTTA SOLAR INC·Filed 2018·Granted Sep 24, 2019·6 cites·22 claims
- 0878US7856607B2System and method for generating at-speed structural tests to improve process and environmental parameter space coverageIBM·Filed 2007·Granted Dec 21, 2010·8 cites·25 claims
- 0976US8490040B2Disposition of integrated circuits using performance sort ring oscillator and performance path testingBICKFORD JEANNE P·Filed 2011·Granted Jul 16, 2013·3 cites·29 claims
- 1076US8230283B2Method to test hold path faults using functional clockingGILLIS PAMELA S·Filed 2009·Granted Jul 24, 2012·9 cites·15 claims
- 1175US9557378B2Method and structure for multi-core chip product test and selective voltage binning dispositionBICKFORD JEANNE P·Filed 2012·Granted Jan 31, 2017·3 cites·25 claims
- 1274US7721170B2Apparatus and method for selectively implementing launch off scan capability in at speed testingIBM·Filed 2007·Granted May 18, 2010·7 cites·14 claims
- 1373US2024283068A1Battery systems wth modular battery packsENPHASE ENERGY INC·Filed 2024·Application pending·0 cites
- 1472US2024162560A1Storage system configured for use with an energy management systemENPHASE ENERGY INC·Filed 2023·Application pending·0 cites
- 1568US7779375B2Design structure for shutting off data capture across asynchronous clock domains during at-speed testingIBM·Filed 2007·Granted Aug 17, 2010·5 cites·11 claims
- 1667US8209141B2System and method for automatically generating test patterns for at-speed structural test of an integrated circuit device using an incremental approach to reduce test pattern countBASSETT ROBERT W·Filed 2009·Granted Jun 26, 2012·7 cites·25 claims
- 1767US2024250393A1Pcba configuration for voltage/temperature sensingENPHASE ENERGY INC·Filed 2024·Application pending·0 cites
- 1866US8538718B2Clock edge grouping for at-speed testGRISE GARY D·Filed 2010·Granted Sep 17, 2013·2 cites·20 claims
- 1965US7685542B2Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testingIBM·Filed 2007·Granted Mar 23, 2010·4 cites·15 claims
- 2064US7529294B2Testing of multiple asynchronous logic domainsIBM·Filed 2006·Granted May 5, 2009·4 cites·20 claims
- 2161US7441171B2Efficient scan chain insertion using broadcast scan for reduced bit collisionsIBM·Filed 2006·Granted Oct 21, 2008·3 cites·20 claims
- 2260US8176362B2Online multiprocessor system reliability defect testingDENNEAU MONTY M·Filed 2008·Granted May 8, 2012·2 cites·15 claims
- 2356US2024363939A1Storage system configured for use with an energy management systemENPHASE ENERGY INC·Filed 2024·Application pending·0 cites
- 2455US8904329B2Systems and methods for single cell product path delay analysisIBM·Filed 2013·Granted Dec 2, 2014·0 cites·8 claims
- 2546US8825433B2Automatic generation of valid at-speed structural test (ASST) test groupsBAALAJI KONDA R·Filed 2011·Granted Sep 2, 2014·1 cites·20 claims
- 2644US2009150844A1Critical path selection for at-speed testIBM·Filed 2007·Application pending·0 cites
- 2741US8996282B2Fueling systems, methods and apparatus for an internal combustion engineSASAKI SHIZUO·Filed 2011·Granted Mar 31, 2015·0 cites·74 claims
- 2841US7793176B2Method of increasing path coverage in transition test generationIBM·Filed 2007·Granted Sep 7, 2010·0 cites·8 claims
- 2941US7784000B2Identifying sequential functional paths for IC testing methods and systemIBM·Filed 2008·Granted Aug 24, 2010·0 cites·6 claims
- 3041US2021281103A1Integrated Solar PV Module-Level Energy Storage and Associated Power Control SystemYOTTA SOLAR INC·Filed 2020·Application pending·0 cites
- 3137US8181135B2Hold transition fault model and test generation methodIYENGAR VIKRAM·Filed 2009·Granted May 15, 2012·0 cites·15 claims
- 3237US2008222472A1Method for automatic test pattern generation for one test constraint at a timeGRISE GARY D·Filed 2007·Application pending·0 cites
- 3336US9043180B2Reducing power consumption during manufacturing test of an integrated circuitIYENGAR VIKRAM·Filed 2012·Granted May 26, 2015·0 cites·16 claims
- 3427US2012176144A1At-speed scan enable switching circuitIYENGAR VIKRAM·Filed 2011·Application pending·0 cites
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