Inventor · disambiguated record
Alan J. Weger
Also filed as: WEGER ALAN · WEGER ALAN J
26 granted patents·3 pending applications·163 citations·filing 2003–2018
95Inventor score
Top patents by PatentIndex Score
29 records- 0196US7886172B2Method of virtualization and OS-level thermal management and multithreaded processor with virtualization and OS-level thermal managementIBM·Filed 2007·Granted Feb 8, 2011·43 cites·20 claims
- 0286US8131056B2Constructing variability maps by correlating off-state leakage emission images to layout informationPOLONSKY STANISLAV·Filed 2008·Granted Mar 6, 2012·11 cites·25 claims
- 0385US9261561B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2015·Granted Feb 16, 2016·2 cites·20 claims
- 0484US9081049B2Minimum-spacing circuit design and layout for PICAIBM·Filed 2013·Granted Jul 14, 2015·4 cites·29 claims
- 0583US7698114B2Techniques for distributing power in electronic circuits and computer systemsIBM·Filed 2005·Granted Apr 13, 2010·16 cites·15 claims
- 0683US7446550B2Enhanced signal observability for circuit analysisIBM·Filed 2007·Granted Nov 4, 2008·10 cites·14 claims
- 0780US6943578B1Method and application of PICA (picosecond imaging circuit analysis) for high current pulsed phenomenaIBM·Filed 2004·Granted Sep 13, 2005·24 cites·30 claims
- 0878US7788058B2Method and apparatus for diagnosing broken scan chain based on leakage light emissionIBM·Filed 2008·Granted Aug 31, 2010·7 cites·24 claims
- 0977US8248097B2Method and apparatus for probing a waferIPPOLITO STEPHEN BRADLEY·Filed 2009·Granted Aug 21, 2012·8 cites·7 claims
- 1076US10102090B2Non-destructive analysis to determine use history of processorIBM·Filed 2016·Granted Oct 16, 2018·2 cites·20 claims
- 1173US10147175B2Detection of hardware trojan using light emissions with sacrificial maskIBM·Filed 2017·Granted Dec 4, 2018·2 cites·20 claims
- 1270US7167806B2Method and system for measuring temperature and power distribution of a deviceIBM·Filed 2004·Granted Jan 23, 2007·16 cites·9 claims
- 1369US9086457B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2013·Granted Jul 21, 2015·1 cites·20 claims
- 1464US9229044B2Minimum-spacing circuit design and layout for PICAAINSPAN HERSCHEL A·Filed 2012·Granted Jan 5, 2016·1 cites·21 claims
- 1562US10571520B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2017·Granted Feb 25, 2020·0 cites·20 claims
- 1660US9678152B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2016·Granted Jun 13, 2017·0 cites·20 claims
- 1759US9372231B2Scan chain latch design that improves testability of integrated circuitsIBM·Filed 2015·Granted Jun 21, 2016·0 cites·20 claims
- 1858US10552278B2Non-destructive analysis to determine use history of processorIBM·Filed 2018·Granted Feb 4, 2020·0 cites·20 claims
- 1957US7426448B2Method and apparatus for diagnosing broken scan chain based on leakage light emissionIBM·Filed 2004·Granted Sep 16, 2008·6 cites·1 claims
- 2055US7355419B2Enhanced signal observability for circuit analysisIBM·Filed 2004·Granted Apr 8, 2008·5 cites·8 claims
- 2153US9930325B2Minimum-spacing circuit design and layout for PICAIBM·Filed 2015·Granted Mar 27, 2018·0 cites·11 claims
- 2252US11105856B2Detection of performance degradation in integrated circuitsIBM·Filed 2018·Granted Aug 31, 2021·0 cites·20 claims
- 2350US6909295B2Analysis methods of leakage current luminescence in CMOS circuitsIBM·Filed 2003·Granted Jun 21, 2005·5 cites·27 claims
- 2449US9310429B2Method and apparatus for probing a waferIPPOLITO STEPHEN BRADLEY·Filed 2012·Granted Apr 12, 2016·0 cites·9 claims
- 2549US2009112352A1Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2009·Application pending·0 cites
- 2648US2013278285A1Minimum-spacing circuit design and layout for picaAINSPAN HERSCHEL A·Filed 2012·Application pending·0 cites
- 2744US7477961B2Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2006·Granted Jan 13, 2009·0 cites·4 claims
- 2838US2018100891A1Integrated circuit temperature determination using photon emission detectionIBM·Filed 2016·Application pending·0 cites
- 2937US6963811B2Method and apparatus for improved detection of multisynchronous signals titleIBM·Filed 2003·Granted Nov 8, 2005·0 cites·20 claims
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