Inventor · disambiguated record
William A. Fritzsche
Also filed as: FRITZSCHE WILLIAM · FRITZSCHE WILLIAM A
14 granted patents·1 pending application·132 citations·filing 2000–2013
92Inventor score
Files withCREDENCE SYSTEMS CORP6LTX CREDENCE CORP5CREDENCE SYSTEMS SOLUTIONS1JONES CLARK1NPTEST LLC1
Top patents by PatentIndex Score
15 records- 0182US7035755B2Circuit testing with ring-connected test instrument modulesCREDENCE SYSTEMS CORP·Filed 2002·Granted Apr 25, 2006·24 cites·33 claims
- 0279US6492797B1Socket calibration method and apparatusSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Dec 10, 2002·31 cites·13 claims
- 0378US7107173B2Automatic test equipment operating architectureCREDENCE SYSTEMS CORP·Filed 2004·Granted Sep 12, 2006·17 cites·5 claims
- 0475US9459978B2Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under testLTX-CREDENCE CORP·Filed 2013·Granted Oct 4, 2016·6 cites·15 claims
- 0575US7043390B2Circuit testing with ring-connected test instruments modulesCREDENCE SYSTEMS CORP·Filed 2004·Granted May 9, 2006·15 cites·20 claims
- 0672US7496467B2Automatic test equipment operating architectureCREDENCE SYSTEMS CORP·Filed 2006·Granted Feb 24, 2009·5 cites·22 claims
- 0767US7302358B2Automatic test equipment operating architectureCREDENCE SYSTEMS SOLUTIONS·Filed 2006·Granted Nov 27, 2007·4 cites·15 claims
- 0865US9336108B2Scalable test platformLTX CREDENCE CORP·Filed 2013·Granted May 10, 2016·2 cites·18 claims
- 0963US9430348B2Scalable test platform in a PCI express environment with direct memory accessLTX-CREDENCE CORP·Filed 2013·Granted Aug 30, 2016·2 cites·14 claims
- 1063US9430349B2Scalable test platform in a PCI express environment with direct memory accessLTX-CREDENCE CORP·Filed 2013·Granted Aug 30, 2016·2 cites·12 claims
- 1163US9213616B2Automated test platform utilizing status register polling with temporal IDLTX CREDENCE CORP·Filed 2013·Granted Dec 15, 2015·2 cites·16 claims
- 1262US6794861B2Method and apparatus for socket calibration of integrated circuit testersNPTEST LLC·Filed 2002·Granted Sep 21, 2004·11 cites·20 claims
- 1361US7099791B2System and method for linking and loading compiled pattern dataCREDENCE SYSTEMS CORP·Filed 2004·Granted Aug 29, 2006·9 cites·15 claims
- 1454US7370255B2Circuit testing with ring-connected test instrument modulesCREDENCE SYSTEMS CORP·Filed 2005·Granted May 6, 2008·2 cites·24 claims
- 1523US2005261857A1System and method for linking and loading compiled pattern dataJONES CLARK·Filed 2004·Application pending·0 cites
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