Inventor · disambiguated record
Teruhiko Funakura
Also filed as: FUNAKURA TERUHIKO
22 granted patents·379 citations·filing 1991–2005
96Inventor score
Files withMITSUBISHI ELECTRIC CORP12RENESAS TECH CORP8RENESAS SEMICONDUCTOR ENGINEER1RYODEN SEMICONDUCTOR SYST ENG1
Top patents by PatentIndex Score
22 records- 0192US7058865B2Apparatus for testing semiconductor integrated circuitRENESAS TECH CORP·Filed 2003·Granted Jun 6, 2006·60 cites·20 claims
- 0284US6642736B2Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuitsMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Nov 4, 2003·30 cites·18 claims
- 0383US6690189B2Apparatus and method for testing semiconductor integrated circuitRENESAS TECH CORP·Filed 2001·Granted Feb 10, 2004·32 cites·8 claims
- 0482US6934648B2Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signalRYODEN SEMICONDUCTOR SYST ENG·Filed 2003·Granted Aug 23, 2005·27 cites·8 claims
- 0578US6714888B2Apparatus for testing semiconductor integrated circuitRENESAS TECH CORP·Filed 2001·Granted Mar 30, 2004·23 cites·7 claims
- 0676US6954079B2Interface circuit coupling semiconductor test apparatus with tested semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Oct 11, 2005·23 cites·17 claims
- 0773US7079060B2Test circuit for evaluating characteristic of analog signal of deviceRENESAS TECH CORP·Filed 2005·Granted Jul 18, 2006·7 cites·9 claims
- 0873US6634004B1Threshold analysis system capable of deciding all threshold voltages included in memory device through single processingMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Oct 14, 2003·20 cites·16 claims
- 0971US6456102B1External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 24, 2002·15 cites·11 claims
- 1070US6661248B2Tester for semiconductor integrated circuitsMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Dec 9, 2003·14 cites·17 claims
- 1168US6653855B2External test auxiliary device to be used for testing semiconductor deviceRENESAS TECH CORP·Filed 2001·Granted Nov 25, 2003·13 cites·4 claims
- 1263US5959463ASemiconductor test apparatus for measuring power supply current of semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Sep 28, 1999·25 cites·2 claims
- 1362US6628137B2Apparatus and method for testing semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 30, 2003·10 cites·9 claims
- 1460US6651023B2Semiconductor test apparatus, and method of testing semiconductor deviceRENESAS TECH CORP·Filed 2001·Granted Nov 18, 2003·9 cites·11 claims
- 1557US6281698B1LSI testing apparatus and timing calibration method for use therewithMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Aug 28, 2001·21 cites·13 claims
- 1656US5485114ASemiconductor integrated circuit with internal compensation for changes in time delayMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jan 16, 1996·16 cites·8 claims
- 1754US6900627B2Apparatus and method for testing semiconductor integrated circuitRENESAS SEMICONDUCTOR ENGINEER·Filed 2001·Granted May 31, 2005·8 cites·11 claims
- 1848US6587975B2Semiconductor test apparatus and methodMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Jul 1, 2003·11 cites·13 claims
- 1947US6546525B2LSI testing apparatusMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 8, 2003·4 cites·20 claims
- 2043US6990614B1Data storage apparatus and data measuring apparatusRENESAS TECH CORP·Filed 2000·Granted Jan 24, 2006·5 cites·9 claims
- 2143US6522126B1Semiconductor tester, and method of testing semiconductor using the sameMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 18, 2003·3 cites·6 claims
- 2231US5172047ASemiconductor test apparatusMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Dec 15, 1992·3 cites·4 claims
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