Inventor · disambiguated record
Matthias Pflanz
Also filed as: PFLANZ MATTHIAS
8 granted patents·4 pending applications·55 citations·filing 2006–2023
82Inventor score
Top patents by PatentIndex Score
12 records- 0191US9594683B2Data processing in a multiple processor system to maintain multiple processor cache memory access coherencyIBM·Filed 2014·Granted Mar 14, 2017·35 cites·12 claims
- 0278US7987384B2Method, system, and computer program product for handling errors in a cache without processor core recoveryIBM·Filed 2008·Granted Jul 26, 2011·9 cites·30 claims
- 0375US7890903B2Method and system for formal verification of an electronic circuit designIBM·Filed 2008·Granted Feb 15, 2011·8 cites·10 claims
- 0470US8302043B2Verification of logic circuit designs using dynamic clock gatingHABERMANN CHRISTIAN·Filed 2010·Granted Oct 30, 2012·3 cites·15 claims
- 0554US11209479B2Stressing integrated circuits using a radiation sourceIBM·Filed 2019·Granted Dec 28, 2021·0 cites·20 claims
- 0653US2025181809A1Optimizing the error checking logic in a processorIBM·Filed 2023·Application pending·0 cites
- 0751US8015451B2Controlling an unreliable data transfer in a data channelIBM·Filed 2009·Granted Sep 6, 2011·0 cites·18 claims
- 0847US7949968B2Method and system for building binary decision diagrams optimally for nodes in a netlist graph using don't-caringIBM·Filed 2007·Granted May 24, 2011·0 cites·14 claims
- 0946US10684930B2Functional testing of high-speed serial linksIBM·Filed 2017·Granted Jun 16, 2020·0 cites·20 claims
- 1042US2007038693A1Method and Processor for Performing a Floating-Point Instruction Within a ProcessorJACOBI CHRISTIAN·Filed 2006·Application pending·0 cites
- 1142US2007050740A1Method and System for Performing Functional Formal Verification of Logic CircuitsJACOBI CHRISTIAN·Filed 2006·Application pending·0 cites
- 1237US2007168792A1Method to Reduce Leakage Within a Sequential Network and Latch CircuitIBM·Filed 2006·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →