Inventor · disambiguated record
Aliasghar Keyvani Janbahan
Also filed as: KEYVANI JANBAHAN ALIASGHAR
1 granted patent·3 pending applications·0 citations·filing 2016–2022
3Inventor score
Top patents by PatentIndex Score
4 records- 0144US2024118629A1Methods of fitting measurement data to a model and modeling a performance parameter distribution and associated apparatusesASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 0241US2024231233A9Methods and apparatus for characterizing a semiconductor manufacturing processASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0330US10697998B2Method of performing surface measurements on a surface of a sample, and scanning probe microscopy system thereforeTNO·Filed 2016·Granted Jun 30, 2020·0 cites·20 claims
- 0425US2019353681A1Method of modifying a surface of a sample, and a scanning probe microscopy systemTNO·Filed 2017·Application pending·0 cites
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