Inventor · disambiguated record
Jyh-Kang Ting
Also filed as: TING JYH-KANG
26 granted patents·1 pending application·318 citations·filing 1994–2020
95Inventor score
Top patents by PatentIndex Score
27 records- 0193US9551923B2Cut mask design layers to provide compact cell heightTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jan 24, 2017·13 cites·19 claims
- 0291US9984191B2Cell layout and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted May 29, 2018·13 cites·20 claims
- 0389US5480828ADifferential gate oxide process by depressing or enhancing oxidation rate for mixed 3/5 V CMOS processTAIWAN SEMICONDUCTOR MFG·Filed 1994·Granted Jan 2, 1996·103 cites·16 claims
- 0487US9136168B2Conductive line patterningTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Sep 15, 2015·5 cites·20 claims
- 0586US5804488AMethod of forming a tungsten silicide capacitor having a high breakdown voltageTAIWAN SEMICONDUCTOR MFG·Filed 1995·Granted Sep 8, 1998·73 cites·18 claims
- 0685US9047437B2Method, system and software for accessing design rules and library of design features while designing semiconductor device layoutTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jun 2, 2015·8 cites·19 claims
- 0781US9508791B2Semiconductor device having a metal gateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Nov 29, 2016·3 cites·20 claims
- 0874US5635421AMethod of making a precision capacitor arrayTAIWAN SEMICONDUCTOR MFG·Filed 1995·Granted Jun 3, 1997·32 cites·7 claims
- 0969US9349634B2Semiconductor arrangement and formation thereofTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted May 24, 2016·2 cites·20 claims
- 1068US11281835B2Cell layout and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 22, 2022·0 cites·20 claims
- 1167US9746783B2Method for preventing photoresist corner rounding effectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 29, 2017·1 cites·20 claims
- 1265US10998304B2Conductive line patterningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 4, 2021·0 cites·20 claims
- 1360US10664639B2Cell layout and structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 26, 2020·0 cites·20 claims
- 1460US5838032APrecision capacitor arrayTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Nov 17, 1998·17 cites·9 claims
- 1559US10269785B2Conductive line patterningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 23, 2019·0 cites·20 claims
- 1659US5554558AMethod of making high precision w-polycide-to-poly capacitors in digital/analog processTAIWAN SEMICONDUCTOR MFG·Filed 1995·Granted Sep 10, 1996·25 cites·12 claims
- 1758US8806417B1Rule coverage rate auto-extraction and rule number auto-markTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Aug 12, 2014·1 cites·25 claims
- 1856US9472501B2Conductive line patterningTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 18, 2016·0 cites·20 claims
- 1955US8769475B2Method, system and software for accessing design rules and library of design features while designing semiconductor device layoutCHEN CHIN-AN·Filed 2011·Granted Jul 1, 2014·1 cites·18 claims
- 2054US9391056B2Mask optimization for multi-layer contactsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 12, 2016·0 cites·20 claims
- 2154US9087773B2Implant region definitionTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jul 21, 2015·0 cites·20 claims
- 2254US5952698ALayout pattern for improved MOS device matchingTAIWAN SEMICONDUCTOR MFG·Filed 1995·Granted Sep 14, 1999·13 cites·22 claims
- 2350US10283495B2Mask optimization for multi-layer contactsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted May 7, 2019·0 cites·20 claims
- 2450US9637818B2Implant region definitionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 2, 2017·0 cites·13 claims
- 2547US9620420B2Semiconductor arrangement and formation thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 11, 2017·0 cites·20 claims
- 2645US6169314B1Layout pattern for improved MOS device matchingTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Jan 2, 2001·8 cites·10 claims
- 2741US2007158835A1Method for designing interconnect for a new processing technologyTAIWAN SEMICONDUCTOR MFG·Filed 2006·Application pending·0 cites
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