Inventor · disambiguated record
Kenji Nakahira
Also filed as: NAKAHIRA KENJI
20 granted patents·6 pending applications·72 citations·filing 2007–2017
93Inventor score
Top patents by PatentIndex Score
26 records- 0192US8461527B2Scanning electron microscope and method for processing an image obtained by the scanning electron microscopeNAKAHIRA KENJI·Filed 2012·Granted Jun 11, 2013·10 cites·12 claims
- 0291US9305343B2Observation device and observation methodHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 5, 2016·7 cites·14 claims
- 0385US8237119B2Scanning type charged particle beam microscope and an image processing method using the sameNAKAHIRA KENJI·Filed 2009·Granted Aug 7, 2012·8 cites·11 claims
- 0485US7903867B2Method and apparatus for displaying detected defectsHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 8, 2011·8 cites·8 claims
- 0583US9824853B2Electron microscope device and imaging method using sameHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 21, 2017·4 cites·16 claims
- 0681US9408591B2Ultrasound diagnostic device and method of generating an intermediary image of ultrasound imageHITACHI MEDICAL CORP·Filed 2015·Granted Aug 9, 2016·4 cites·14 claims
- 0781US8824773B2Defect observation method and defect observation deviceMINEKAWA YOHEI·Filed 2010·Granted Sep 2, 2014·6 cites·20 claims
- 0881US8106357B2Scanning electron microscope and method for processing an image obtained by the scanning electron microscopeNAKAHIRA KENJI·Filed 2008·Granted Jan 31, 2012·5 cites·11 claims
- 0978US9019362B2Charged particle beam device and a method of improving image quality of the sameBAI JIE·Filed 2010·Granted Apr 28, 2015·4 cites·14 claims
- 1075US9360434B2Optical inspection apparatus and method thereofHITACHI LTD·Filed 2013·Granted Jun 7, 2016·2 cites·16 claims
- 1171US9342879B2Method and apparatus for reviewing defectMINEKAWA YOHEI·Filed 2012·Granted May 17, 2016·3 cites·17 claims
- 1271US9341584B2Charged-particle microscope device and method for inspecting sample using sameNAKAHIRA KENJI·Filed 2010·Granted May 17, 2016·3 cites·9 claims
- 1367US9741530B2Charged-particle-beam device, specimen-image acquisition method, and program recording mediumHITACHI HIGH TECH CORP·Filed 2014·Granted Aug 22, 2017·1 cites·20 claims
- 1467US8730318B2Inspection apparatus and method for producing image for inspectionNAKAHIRA KENJI·Filed 2011·Granted May 20, 2014·1 cites·8 claims
- 1563US8585599B2Ultrasonographic device and method for improving ultrasonographic device image qualityNAKAHIRA KENJI·Filed 2008·Granted Nov 19, 2013·3 cites·8 claims
- 1662US9245323B2Medical diagnostic device and method of improving image quality of medical diagnostic deviceBAI JIE·Filed 2009·Granted Jan 26, 2016·3 cites·11 claims
- 1757US2014210988A1Inspection Apparatus and Method for Producing Image for InspectionHITACHI GE NUCLEAR ENERGY LTD·Filed 2014·Application pending·0 cites
- 1853US2011187847A1Scanning type charged particle microscope device and method for processing image acquired with scanning type charged particle microscope deviceBAI JIE·Filed 2009·Application pending·0 cites
- 1949US9859093B2Method of improving quality of scanning charged particle microscope image, and scanning charged particle microscope apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 2, 2018·0 cites·14 claims
- 2048US10889526B2Environmental resistant coating memberJAPAN FINE CERAMICS CT·Filed 2017·Granted Jan 12, 2021·0 cites·6 claims
- 2145US9460889B2Charged particle microscope device and image capturing methodNAKAHIRA KENJI·Filed 2012·Granted Oct 4, 2016·0 cites·8 claims
- 2245US9267898B2Optical inspection method and optical inspection apparatusNAKAHIRA KENJI·Filed 2011·Granted Feb 23, 2016·0 cites·4 claims
- 2345US2015149475A1Data harmonic analysis method and data analysis deviceHITACHI LTD·Filed 2013·Application pending·0 cites
- 2444US2013090560A1Ultrasound image reconstruction method, device therefor, and ultrasound diagnostic deviceKOTAKI GO·Filed 2011·Application pending·0 cites
- 2537US2012041312A1Method for Improving Image Quality of Ultrasonic Image, Ultrasonic Diagnosis Device, and Program for Improving Image QualityNAKAHIRA KENJI·Filed 2010·Application pending·0 cites
- 2634US2013010100A1Image generating method and device using scanning charged particle microscope, sample observation method, and observing deviceKOTAKI GO·Filed 2011·Application pending·0 cites
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