Inventor · disambiguated record

Katsuhide Matsumoto

Also filed as: MATSUMOTO KATSUHIDE

1 granted patent·2 citations·filing 2005–2005

19Inventor score

Technology areasG01R

Files withNEC ELECTRONICS CORP1

Top patents by PatentIndex Score

1 record

0147US7401276B2Semiconductor device with test circuit and test method of the sameNEC ELECTRONICS CORP·Filed 2005·Granted Jul 15, 2008·2 cites·14 claims

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