Inventor · disambiguated record
Kenji Shintani
Also filed as: SHINTANI KENJI
21 granted patents·3 pending applications·498 citations·filing 1980–2025
96Inventor score
Files withMITSUBISHI ELECTRIC CORP8SONY CORP8SONY PREC ENGINEERING CT S PTE2SONY PREC ENGINEERING CT SINGA2MORIMOTO JUNJI1
Top patents by PatentIndex Score
24 records- 0192US6076483APlasma processing apparatus using a partition panelMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jun 20, 2000·82 cites·4 claims
- 0289US4449213AOptical reading apparatusSONY CORP·Filed 1981·Granted May 15, 1984·64 cites·6 claims
- 0384US6167835B1Two chamber plasma processing apparatusMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 2, 2001·43 cites·2 claims
- 0483US6929712B2Plasma processing apparatus capable of evaluating process performanceRENESAS TECH CORP·Filed 2002·Granted Aug 16, 2005·24 cites·7 claims
- 0581US6366631B1Jitter measuring method utilizing A/D conversion and deviceSONY PREC ENGINEERING CT S PTE·Filed 1998·Granted Apr 2, 2002·57 cites·12 claims
- 0681US4269486AMulti-axis movable mirror deviceSONY CORP·Filed 1980·Granted May 26, 1981·24 cites·5 claims
- 0777US7112746B2Data transmission cableSONY CORP·Filed 2003·Granted Sep 26, 2006·18 cites·2 claims
- 0877US4709139AComa correction in optical head with astigmatism for focusing error detectionSONY CORP·Filed 1986·Granted Nov 24, 1987·22 cites·5 claims
- 0975US4408311AOptical tracking apparatusSONY CORP·Filed 1981·Granted Oct 4, 1983·18 cites·8 claims
- 1071US6392967B1Apparatus for measuring characteristics of optical disc systems and methodSONY PREC ENGINEERING CT S PTE·Filed 1998·Granted May 21, 2002·26 cites·17 claims
- 1167US6246041B1Apparatus and method for measuring focusing characteristics of optical pickup and/or optical disc and apparatus and method for recording and/or reproducing optical discSONY PREC ENGINEERING CT SINGA·Filed 1998·Granted Jun 12, 2001·21 cites·20 claims
- 1267US4482988AObjective lens mount and drive for optical disc playerSONY CORP·Filed 1984·Granted Nov 13, 1984·13 cites·8 claims
- 1365US4592038AOptical reproducing apparatusSONY CORP·Filed 1983·Granted May 27, 1986·12 cites·4 claims
- 1462US6226246B1Apparatus and method for measuring characteristics of optical pickup and/or optical discSONY PREC ENGINEERING CT SINGA·Filed 1998·Granted May 1, 2001·17 cites·8 claims
- 1561US6025907AApparatus and method for measuring characteristics of optical pickup and/or optical discSONY PRECISION ENGINEERING CEN·Filed 1998·Granted Feb 15, 2000·18 cites·6 claims
- 1659US6020570APlasma processing apparatusMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Feb 1, 2000·23 cites·7 claims
- 1758US2025216265A1Thermal infrared detector and method of producing thermal infrared detectorMITSUBISHI ELECTRIC CORP·Filed 2025·Application pending·0 cites
- 1852US6651678B2Method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Nov 25, 2003·6 cites·8 claims
- 1950US8204476B2Portable telephone and electronic deviceMORIMOTO JUNJI·Filed 2007·Granted Jun 19, 2012·3 cites·31 claims
- 2046US6756312B2Method of fabricating a semiconductor device including time-selective etching processMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jun 29, 2004·1 cites·18 claims
- 2145US10274374B2Infrared sensor and infrared solid-state image pickup apparatusMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Apr 30, 2019·0 cites·14 claims
- 2244US4669071APhoto sensor device and optical pickup deviceSONY CORP·Filed 1985·Granted May 26, 1987·6 cites·21 claims
- 2335US2003222349A1Semiconductor device with multilayer interconnection structureMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 2435US2002088542A1Plasma processing apparatusFiled 2000·Application pending·0 cites
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