Inventor · disambiguated record
Garry Mercaldi
Also filed as: MERCALDI GARRY · MERCALDI GARRY A · MERCALDI GARRY ANTHONY
65 granted patents·6 pending applications·865 citations·filing 1998–2009
99Inventor score
Top patents by PatentIndex Score
71 records- 0195US7245010B2System and device including a barrier layerMICRON TECHNOLOGY INC·Filed 2005·Granted Jul 17, 2007·20 cites·2 claims
- 0294US6473328B1Three-dimensional magnetic memory array with a minimal number of access conductors thereinMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 29, 2002·83 cites·38 claims
- 0393US6673675B2Methods of fabricating an MRAM device using chemical mechanical polishingMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 6, 2004·44 cites·28 claims
- 0491US6316370B1Method for etching doped polysilicon with high selectivity to undoped polysiliconMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 13, 2001·47 cites·45 claims
- 0590US6475883B2Method for forming a barrier layerMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 5, 2002·29 cites·22 claims
- 0690US6410968B1Semiconductor device with barrier layerMICRON TECHNOLOGY INC·Filed 2000·Granted Jun 25, 2002·31 cites·11 claims
- 0787US7285811B2MRAM device for preventing electrical shorts during fabricationMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 23, 2007·12 cites·16 claims
- 0887US6541811B2Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layerMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 1, 2003·31 cites·40 claims
- 0987US6471780B1Process for fabricating films of uniform properties on semiconductor devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 29, 2002·21 cites·27 claims
- 1086US5976990AMethod for optimization of thin film depositionMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 2, 1999·96 cites·26 claims
- 1184US6794704B2Method for enhancing electrode surface area in DRAM cell capacitorsMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 21, 2004·24 cites·51 claims
- 1282US6417015B2Semiconductor processing methods and semiconductor defect detection methodsMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 9, 2002·20 cites·20 claims
- 1379US6521544B1Method of forming an ultra thin dielectric filmMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 18, 2003·17 cites·24 claims
- 1479US5969983ACapacitor/antifuse structure having a barrier-layer electrode and improved barrier layerMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 19, 1999·38 cites·9 claims
- 1578US6573554B2Localized masking for semiconductor structure developmentMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 3, 2003·13 cites·48 claims
- 1678US6150706ACapacitor/antifuse structure having a barrier-layer electrode and improved barrier layerMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 21, 2000·34 cites·29 claims
- 1777US7576380B2Methods for enhancing capacitors having roughened features to increase charge-storage capacityMICRON TECHNOLOGY INC·Filed 2006·Granted Aug 18, 2009·4 cites·15 claims
- 1876US6639266B1Modifying material removal selectivity in semiconductor structure developmentMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 28, 2003·19 cites·57 claims
- 1974US6682970B1Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layerMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 27, 2004·14 cites·22 claims
- 2074US6387716B1Semiconductor processing methods and semiconductor defect detection methodsMICRON TECHNOLOGY INC·Filed 2000·Granted May 14, 2002·12 cites·16 claims
- 2174US6358793B1Method for localized masking for semiconductor structure developmentMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 19, 2002·30 cites·74 claims
- 2273US7642157B2Method for enhancing electrode surface area in DRAM cell capacitorsMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 5, 2010·3 cites·32 claims
- 2373US7148555B2Method for enhancing electrode surface area in DRAM cell capacitorsMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 12, 2006·12 cites·66 claims
- 2473US7119388B2MRAM device fabricated using chemical mechanical polishingMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 10, 2006·11 cites·15 claims
- 2573US6670231B2Method of forming a dielectric layer in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 30, 2003·10 cites·9 claims
- 2673US6649278B2Process for fabricating films of uniform properties on semiconductor devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 18, 2003·7 cites·29 claims
- 2772US7034353B2Methods for enhancing capacitors having roughened features to increase charge-storage capacityMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 25, 2006·10 cites·30 claims
- 2870US7989864B2Methods for enhancing capacitors having roughened features to increase charge-storage capacityMICRON TECHNOLOGY INC·Filed 2009·Granted Aug 2, 2011·2 cites·16 claims
- 2970US6987073B2Low selectivity deposition methodsMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 17, 2006·9 cites·16 claims
- 3069US6680229B2Method for enhancing vertical growth during the selective formation of silicon, and structures formed using sameMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 20, 2004·10 cites·29 claims
- 3168US6225157B1Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layerMICRON TECHNOLOGY INC·Filed 1999·Granted May 1, 2001·21 cites·16 claims
- 3266US7468534B2Localized masking for semiconductor structure developmentMICRON TECHNOLOGY INC·Filed 2005·Granted Dec 23, 2008·1 cites·42 claims
- 3365US7060514B2Process for fabricating films of uniform properties on semiconductor devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Jun 13, 2006·4 cites·28 claims
- 3463US7015529B2Localized masking for semiconductor structure developmentMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 21, 2006·5 cites·13 claims
- 3562US6537677B1Process for fabricating films of uniform properties on semiconductor devicesMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 25, 2003·13 cites·49 claims
- 3661US7651956B1Process for fabricating films of uniform properties on semiconductor devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 26, 2010·3 cites·53 claims
- 3761US7573121B2Method for enhancing electrode surface area in DRAM cell capacitorsMICRON TECHNOLOGY INC·Filed 2006·Granted Aug 11, 2009·1 cites·18 claims
- 3861US7112503B1Enhanced surface area capacitor fabrication methodsMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 26, 2006·7 cites·18 claims
- 3961US6368919B2Method and composite for decreasing charge leakageMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 9, 2002·11 cites·24 claims
- 4059US7868369B2Localized masking for semiconductor structure developmentMICRON TECHNOLOGY INC·Filed 2008·Granted Jan 11, 2011·0 cites·17 claims
- 4159US6576964B1Dielectric layer for a semiconductor device having less current leakage and increased capacitanceMICRON TECHNOLOGY INC·Filed 2000·Granted Jun 10, 2003·4 cites·16 claims
- 4259US6251693B1Semiconductor processing methods and semiconductor defect detection methodsMICRON TECHNOLOGY INC·Filed 1998·Granted Jun 26, 2001·17 cites·29 claims
- 4358US6803280B2Method and composite for decreasing charge leakageMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 12, 2004·4 cites·21 claims
- 4458US6774443B2System and device including a barrier layerMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 10, 2004·3 cites·11 claims
- 4558US6746922B2Method and composite for decreasing charge leakageMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 8, 2004·4 cites·18 claims
- 4658US6521945B2Method and composite for decreasing charge leakageMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 18, 2003·4 cites·144 claims
- 4757US6837938B2Apparatus associatable with a deposition chamber to enhance uniformity of properties of material layers formed on semiconductor substrates thereinMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 4, 2005·2 cites·15 claims
- 4857US6392284B1Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layerMICRON TECHNOLOGY INC·Filed 1999·Granted May 21, 2002·13 cites·23 claims
- 4955US7192888B1Low selectivity deposition methodsMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 20, 2007·3 cites·56 claims
- 5055US7008845B2Method and composite for decreasing charge leakageMICRON TECHNOLOGY INC·Filed 2004·Granted Mar 7, 2006·3 cites·56 claims
Showing the top 50 of 71 patent records by PatentIndex Score.
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