Inventor · disambiguated record

Kobi Barkan

Also filed as: BARKAN KOBI

1 granted patent·1 pending application·9 citations·filing 2011–2011

31Inventor score

Technology areasH10P

Files withBERLATZKY YOAV2

Top patents by PatentIndex Score

2 records

0177US8614790B2Optical system and method for inspection of patterned samplesBERLATZKY YOAV·Filed 2011·Granted Dec 24, 2013·9 cites·9 claims
0229US2013148115A1Optical system and method for inspection of patterned samplesBERLATZKY YOAV·Filed 2011·Application pending·0 cites

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