Inventor · disambiguated record
Shiran Gan-Or
Also filed as: GAN-OR SHIRAN
2 granted patents·2 citations·filing 2017–2018
33Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD2
Top patents by PatentIndex Score
2 records- 0170US11037286B2Method of classifying defects in a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Jun 15, 2021·2 cites·20 claims
- 0239US11321633B2Method of classifying defects in a specimen semiconductor examination and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted May 3, 2022·0 cites·19 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →