Inventor · disambiguated record
Hiroyuki Shindo
Also filed as: SHINDO HIROYUKI
73 granted patents·14 pending applications·389 citations·filing 1990–2024
98Inventor score
Files withHITACHI HIGH TECH CORP28SANYO ELECTRIC CO12SEIKO EPSON CORP9NGK INSULATORS LTD6KONICA MINOLTA INC5
Top patents by PatentIndex Score
87 records- 0191US5739797AHead-mounted virtual image display device having switching means enabling user to select eye to view imageSEIKO EPSON CORP·Filed 1995·Granted Apr 14, 1998·111 cites·20 claims
- 0289US11587225B2Pattern inspection systemHITACHI HIGH TECH CORP·Filed 2021·Granted Feb 21, 2023·2 cites·9 claims
- 0389US7679055B2Pattern displacement measuring method and pattern measuring deviceHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 16, 2010·16 cites·4 claims
- 0488US9869856B2Illumination device and projectorSEIKO EPSON CORP·Filed 2014·Granted Jan 16, 2018·7 cites·18 claims
- 0588US9858659B2Pattern inspecting and measuring device and programHITACHI HIGH TECH CORP·Filed 2013·Granted Jan 2, 2018·9 cites·16 claims
- 0688US7864418B2ScreenSEIKO EPSON CORP·Filed 2009·Granted Jan 4, 2011·27 cites·19 claims
- 0787US10937146B2Image evaluation method and image evaluation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Mar 2, 2021·5 cites·18 claims
- 0887US8515153B2System and method of image processing, and scanning electron microscopeSUGIYAMA AKIYUKI·Filed 2011·Granted Aug 20, 2013·13 cites·18 claims
- 0986US11132788B2Pattern inspection systemHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 28, 2021·6 cites·19 claims
- 1086US10078132B2Scanning optical system and radarKONICA MINOLTA INC·Filed 2014·Granted Sep 18, 2018·14 cites·12 claims
- 1186US7864420B2ScreenSEIKO EPSON CORP·Filed 2008·Granted Jan 4, 2011·10 cites·12 claims
- 1285US8054731B2Photodetector and optical pickup apparatusSANYO ELECTRIC CO·Filed 2007·Granted Nov 8, 2011·6 cites·13 claims
- 1382US7744227B2Projector including a turn table for shifting a lens barrelSEIKO EPSON CORP·Filed 2006·Granted Jun 29, 2010·7 cites·8 claims
- 1481US9846931B2Pattern sensing device and semiconductor sensing systemHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 19, 2017·5 cites·15 claims
- 1581US8173962B2Pattern displacement measuring method and pattern measuring deviceSUTANI TAKUMICHI·Filed 2010·Granted May 8, 2012·6 cites·4 claims
- 1678US9755191B2Method and apparatus for manufacturing organic electroluminescent element, and organic electroluminescent moduleKONICA MINOLTA INC·Filed 2014·Granted Sep 5, 2017·3 cites·7 claims
- 1778US7664004B2Optical pickup apparatusSANYO ELECTRIC CO·Filed 2007·Granted Feb 16, 2010·3 cites·8 claims
- 1877US7639591B2Photodetector and optical pickup apparatusSANYO ELECTRIC CO·Filed 2006·Granted Dec 29, 2009·3 cites·13 claims
- 1977US7457055B2Lens driving apparatus and optical pickup unit having the sameSANYO ELECTRIC CO·Filed 2007·Granted Nov 25, 2008·3 cites·9 claims
- 2076US8780444B2Screen and projection systemARAKAWA OSAMU·Filed 2012·Granted Jul 15, 2014·3 cites·21 claims
- 2176US7481538B2Illuminator and projectorSEIKO EPSON CORP·Filed 2006·Granted Jan 27, 2009·17 cites·8 claims
- 2275US9990708B2Pattern-measuring apparatus and semiconductor-measuring systemHITACHI HIGH TECH CORP·Filed 2014·Granted Jun 5, 2018·3 cites·5 claims
- 2375US7921437B2Optical pick apparatusSANYO ELECTRIC CO·Filed 2007·Granted Apr 5, 2011·2 cites·4 claims
- 2475US5963515AOptical pickup device for detecting a tracking error of a main spot on an optical diskTEAC CORP·Filed 1997·Granted Oct 5, 1999·28 cites·16 claims
- 2575US2024404043A1Image Processing Program, Image Processing Device, and Image Processing MethodHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 2673US8942464B2Pattern measuring apparatus, and pattern measuring method and programSHIBAHARA TAKUMA·Filed 2011·Granted Jan 27, 2015·4 cites·9 claims
- 2773US7889909B2Pattern matching method and pattern matching programHITACHI HIGH TECH CORP·Filed 2007·Granted Feb 15, 2011·6 cites·8 claims
- 2872US9165214B2Image processing device and computer programABE YUICHI·Filed 2011·Granted Oct 20, 2015·3 cites·19 claims
- 2972US8342002B2Inspection apparatus for sensor element, and method for inspecting electrical characteristics of sensor elementNGK INSULATORS LTD·Filed 2011·Granted Jan 1, 2013·2 cites·15 claims
- 3072US8094920B2System and method of image processing, and scanning electron microscopeSUGIYAMA AKIYUKI·Filed 2006·Granted Jan 10, 2012·8 cites·9 claims
- 3171US10445875B2Pattern-measuring apparatus and semiconductor-measuring systemHITACHI HIGH TECH CORP·Filed 2018·Granted Oct 15, 2019·1 cites·7 claims
- 3271US8174689B2Apparatus for inspecting defects of honeycomb structureAKAO TAKAYOSHI·Filed 2009·Granted May 8, 2012·3 cites·7 claims
- 3369US11836906B2Image processing system and computer program for performing image processingHITACHI HIGH TECH CORP·Filed 2021·Granted Dec 5, 2023·0 cites·6 claims
- 3469US8128395B2Honeycomb segment-forming die and method for manufacturing honeycomb structureSHINDO HIROYUKI·Filed 2009·Granted Mar 6, 2012·2 cites·7 claims
- 3569US7925095B2Pattern matching method and computer program for executing pattern matchingHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 12, 2011·6 cites·15 claims
- 3668US8154978B2Optical pickup apparatusHOTTA TOHRU·Filed 2008·Granted Apr 10, 2012·1 cites·4 claims
- 3767US11176405B2Image processing system and computer program for performing image processingHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 16, 2021·1 cites·11 claims
- 3867US6542315B2Optical pick-up deviceTEAC CORP·Filed 2001·Granted Apr 1, 2003·6 cites·5 claims
- 3966US10989794B2Scanning optical system and radarKONICA MINOLTA INC·Filed 2018·Granted Apr 27, 2021·1 cites·10 claims
- 4066US8959461B2Pattern measurement device and pattern measurement methodSHIBAHARA TAKUMA·Filed 2012·Granted Feb 17, 2015·2 cites·11 claims
- 4165US8359761B2Measuring equipment and method for forming laminated bodyNGK INSULATORS LTD·Filed 2010·Granted Jan 29, 2013·2 cites·10 claims
- 4265US8202602B2Honeycomb segment with spacer and honeycomb structureSHINDO HIROYUKI·Filed 2009·Granted Jun 19, 2012·2 cites·4 claims
- 4364US8087037B2Optical pickup apparatusKAWASAKI RYOICHI·Filed 2011·Granted Dec 27, 2011·1 cites·6 claims
- 4463US8169702B2Screen unitKUROI KIYOSHI·Filed 2011·Granted May 1, 2012·1 cites·18 claims
- 4563USD380032SVirtual vision displaySEIKO EPSON CORP·Filed 1995·Granted Jun 17, 1997·12 cites·1 claims
- 4663US2024198534A1Robot inspection systemSEIKO EPSON CORP·Filed 2023·Application pending·0 cites
- 4762US12125176B2Inspection apparatus and measurement apparatusHITACHI HIGH TECH CORP·Filed 2022·Granted Oct 22, 2024·0 cites·14 claims
- 4860US8646306B2Method for manufacturing sensor element for gas sensorSHINDO HIROYUKI·Filed 2010·Granted Feb 11, 2014·1 cites·14 claims
- 4959US7742382B2Laser converging apparatus, optical pickup device and optical disc recording/reproduction apparatusSANYO ELECTRIC CO·Filed 2006·Granted Jun 22, 2010·0 cites·6 claims
- 5058US12211194B2Defect inspection with images of different synthesis ratiosHITACHI HIGH TECH CORP·Filed 2022·Granted Jan 28, 2025·0 cites·10 claims
Showing the top 50 of 87 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →