Inventor · disambiguated record

Tianqi Wan

Also filed as: WAN TIANQI

1 granted patent·0 citations·filing 2023–2023

1Inventor score

Technology areasG06F

Files withBEIJING AEROSPACE INST METROLOGY & MEASUREMENT TECH1

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0144US12306745B2Method for assessing test adequacy of neural network based on element decompositionBEIJING AEROSPACE INST METROLOGY & MEASUREMENT TECH·Filed 2023·Granted May 20, 2025·0 cites·5 claims

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Tianqi Wan — Patent Inventor | PatentIndex