Inventor · disambiguated record
Bruce H. Newcome
Also filed as: NEWCOME BRUCE · NEWCOME BRUCE H
12 granted patents·1 pending application·158 citations·filing 1982–2024
89Inventor score
Top patents by PatentIndex Score
13 records- 0196US7359487B1Diamond anodeREVERA INC·Filed 2005·Granted Apr 15, 2008·66 cites·52 claims
- 0295US4490806AHigh repetition rate transient recorder with automatic integrationRESEARCH CORP·Filed 1982·Granted Dec 25, 1984·67 cites·16 claims
- 0391US10056242B2Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometryNOVA MEASURING INSTR INC·Filed 2016·Granted Aug 21, 2018·5 cites·13 claims
- 0490US11996259B2Patterned x-ray emitting targetNOVA MEASURING INSTR INC·Filed 2020·Granted May 28, 2024·2 cites·16 claims
- 0586US12165863B2Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometryNOVA MEASURING INSTR INC·Filed 2023·Granted Dec 10, 2024·0 cites·18 claims
- 0682US11764050B2Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometryNOVA MEASURING INSTR INC·Filed 2022·Granted Sep 19, 2023·0 cites·20 claims
- 0776US11430647B2Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass SpectrometryNOVA MEASURING INSTR INC·Filed 2021·Granted Aug 30, 2022·0 cites·21 claims
- 0873US10910208B2Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometryNOVA MEASURING INSTR INC·Filed 2020·Granted Feb 2, 2021·0 cites·20 claims
- 0970US8011830B2Method and system for calibrating an X-ray photoelectron spectroscopy measurementREVERA INC·Filed 2009·Granted Sep 6, 2011·2 cites·26 claims
- 1069US10636644B2Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometryNOVA MEASURING INSTR INC·Filed 2019·Granted Apr 28, 2020·0 cites·7 claims
- 1166US10403489B2Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometryNOVA MEASURING INSTR INC·Filed 2018·Granted Sep 3, 2019·0 cites·22 claims
- 1263US2025006451A1Patterned x-ray emitting targetNOVA MEASURING INSTR INC·Filed 2024·Application pending·0 cites
- 1361US5103083APosition sensitive detector and method using successive interdigitated electrodes with different patternsCHARLES EVANS & ASSOCIATES·Filed 1990·Granted Apr 7, 1992·16 cites·16 claims
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