Inventor · disambiguated record
Gunaseelan Ponnuvel
Also filed as: PONNUVEL GUNASEELAN
8 granted patents·4 pending applications·5 citations·filing 2012–2025
75Inventor score
Files withNVIDIA CORP12
Top patents by PatentIndex Score
12 records- 0187US11131711B1Testing system and method for in chip decoupling capacitor circuitsNVIDIA CORP·Filed 2020·Granted Sep 28, 2021·3 cites·20 claims
- 0266US11693753B2Enhanced in-system test coverage based on detecting component degradationNVIDIA CORP·Filed 2019·Granted Jul 4, 2023·1 cites·20 claims
- 0364US2025346114A1Die Crack Detection SystemNVIDIA CORP·Filed 2025·Application pending·0 cites
- 0456US2025377404A1Thermal measurement for complex thermal stack up productsNVIDIA CORP·Filed 2024·Application pending·0 cites
- 0555US9007079B2System and method for compensating measured IDDQ valuesNVIDIA CORP·Filed 2012·Granted Apr 14, 2015·1 cites·20 claims
- 0652US2025217224A1Language model-assisted system installation, diagnostics, and debuggingNVIDIA CORP·Filed 2024·Application pending·0 cites
- 0750US11777483B1On-die techniques for asynchnorously comparing voltagesNVIDIA CORP·Filed 2022·Granted Oct 3, 2023·0 cites·20 claims
- 0848US11619661B1On-die techniques for converting currents to frequenciesNVIDIA CORP·Filed 2022·Granted Apr 4, 2023·0 cites·20 claims
- 0946US11494370B2Hardware-controlled updating of a physical operating parameter for in-field fault detectionNVIDIA CORP·Filed 2020·Granted Nov 8, 2022·0 cites·21 claims
- 1043US9207277B2System and method for generating a yield forecast based on wafer acceptance testsNVIDIA CORP·Filed 2012·Granted Dec 8, 2015·0 cites·20 claims
- 1140US9293380B2System and method for selecting a derating factor to balance use of components having disparate electrical characteristicsNVIDIA CORP·Filed 2012·Granted Mar 22, 2016·0 cites·17 claims
- 1230US2014214342A1Verification of test program stability and wafer fabrication process sensitivityNVIDIA CORP·Filed 2013·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →