Inventor · disambiguated record
Iwao Suzuki
Also filed as: SUZUKI IWAO
11 granted patents·2 pending applications·42 citations·filing 2001–2022
87Inventor score
Files withHITACHI HIGH TECH CORP7RENESAS ELECTRONICS CORP2RENESAS TECH CORP2CHIKAMA YOSHIMASA1RENESAS TECHNOLOGY CORP & HITA1
Top patents by PatentIndex Score
13 records- 0183US10514386B2Sample liquid-surface position measurement device and sample liquid-surface position measurement methodHITACHI HIGH TECH CORP·Filed 2017·Granted Dec 24, 2019·3 cites·13 claims
- 0279US10247743B2Analyte testing automation system, biological sample check module, and biological sample check methodHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 2, 2019·3 cites·15 claims
- 0378US9632100B2Sample pretreatment system that supports multisystem configurationHITACHI HIGH TECH CORP·Filed 2012·Granted Apr 25, 2017·3 cites·8 claims
- 0474US9804065B2System for pretreating sampleHITACHI HIGH TECH CORP·Filed 2013·Granted Oct 31, 2017·2 cites·5 claims
- 0573US7774667B2Semiconductor device and data processing systemRENESAS TECH CORP·Filed 2008·Granted Aug 10, 2010·10 cites·20 claims
- 0669US10677844B2Semiconductor device and test method for semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted Jun 9, 2020·1 cites·13 claims
- 0766US6826720B2Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memoryRENESAS TECH CORP·Filed 2001·Granted Nov 30, 2004·13 cites·13 claims
- 0861US9469897B2Thin film forming apparatus and thin film forming methodCHIKAMA YOSHIMASA·Filed 2011·Granted Oct 18, 2016·1 cites·8 claims
- 0957US2024280602A1Automatic analysis device control method and automatic analysis deviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1051US11982655B2Analysis apparatus having a plurality of liquid chromatographs and its analysis methodHITACHI HIGH TECH CORP·Filed 2019·Granted May 14, 2024·0 cites·11 claims
- 1146US7225372B2Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memoryRENESAS TECHNOLOGY CORP & HITA·Filed 2004·Granted May 29, 2007·6 cites·6 claims
- 1240US11085913B2Biological sample analyzerHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 10, 2021·0 cites·11 claims
- 1339US2017249224A1Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2016·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →