Inventor · disambiguated record

Chaeho Shin

Also filed as: SHIN ChaeHo

1 granted patent·3 citations·filing 2016–2016

21Inventor score

Technology areasG01Q

Files withKOREA RES INST STANDARDS & SCI1

Top patents by PatentIndex Score

1 record

0178US10191081B2Measuring method for atomic force microscopeKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Jan 29, 2019·3 cites·9 claims

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