Inventor · disambiguated record

Kenji Fukuzawa

Also filed as: FUKUZAWA KENJI

1 granted patent·5 citations·filing 2007–2007

26Inventor score

Technology areasG01Q

Files withJAPAN SCIENCE & TECH AGENCY1

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1 record

0165US7557933B2Measuring probe, sample surface measuring apparatus and sample surface measuring methodJAPAN SCIENCE & TECH AGENCY·Filed 2007·Granted Jul 7, 2009·5 cites·16 claims

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Kenji Fukuzawa — Patent Inventor | PatentIndex