Inventor · disambiguated record
Norihiro Takesako
Also filed as: TAKESAKO NORIHIRO
10 granted patents·9 citations·filing 2001–2016
81Inventor score
Files withMITSUBISHI ELECTRIC CORP10
Top patents by PatentIndex Score
10 records- 0171US10359448B2Device and method for inspecting position of probe, and semiconductor evaluation apparatusMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Jul 23, 2019·1 cites·30 claims
- 0271US10209273B2Probe position inspection apparatus, semiconductor device inspection apparatus and semiconductor device inspection methodMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Feb 19, 2019·1 cites·19 claims
- 0370US9257316B2Semiconductor testing jig and transfer jig for the sameMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Feb 9, 2016·2 cites·19 claims
- 0466US10068814B2Apparatus and method for evaluating semiconductor device comprising thermal image processingMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Sep 4, 2018·1 cites·15 claims
- 0564US8980655B2Test apparatus and test methodMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Mar 17, 2015·1 cites·20 claims
- 0646US9995786B2Apparatus and method for evaluating semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Jun 12, 2018·0 cites·15 claims
- 0746US9804197B2Evaluation apparatus and probe position inspection methodMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Oct 31, 2017·0 cites·17 claims
- 0846US9678143B2Semiconductor evaluation apparatusMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Jun 13, 2017·0 cites·11 claims
- 0944US9562929B2Measurement deviceMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Feb 7, 2017·0 cites·17 claims
- 1042US6556880B2Production schedule planning device and a method of producing a semiconductor device using the sameMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 29, 2003·3 cites·8 claims
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