Inventor · disambiguated record
Takeshi Hagino
Also filed as: HAGINO TAKESHI
20 granted patents·1 pending application·44 citations·filing 2008–2025
91Inventor score
Top patents by PatentIndex Score
21 records- 0186US10352678B2Coefficient-of-thermal-expansion measurement method of dimension reference gauge, measuring device for coefficient of thermal expansion and reference gaugeMITUTOYO CORP·Filed 2016·Granted Jul 16, 2019·3 cites·24 claims
- 0284US8356417B2Spherical-form measuring apparatusMITUTOYO CORP·Filed 2011·Granted Jan 22, 2013·8 cites·2 claims
- 0375US10627204B2Coefficient-of-thermal-expansion measurement method and measuring device for coefficient of thermal expansionMITUTOYO CORP·Filed 2017·Granted Apr 21, 2020·2 cites·9 claims
- 0475US8536548B2Particle beam therapy systemOTANI TOSHIHIRO·Filed 2011·Granted Sep 17, 2013·16 cites·16 claims
- 0574US9347771B2Spherical shape measurement method and apparatusMITUTOYO CORP·Filed 2015·Granted May 24, 2016·2 cites·12 claims
- 0670US9518944B2Temperature-controlled bathMITUTOYO CORP·Filed 2014·Granted Dec 13, 2016·1 cites·12 claims
- 0769US8379222B2Fizeau interferometer and measurement method using Fizeau interferometerMITUTOYO CORP·Filed 2010·Granted Feb 19, 2013·3 cites·2 claims
- 0865US8879068B2Abscissa calibration jig and abscissa calibration method of laser interference measuring apparatusHAGINO TAKESHI·Filed 2012·Granted Nov 4, 2014·2 cites·3 claims
- 0961US8299447B2Rotating irradiation apparatusHAGINO TAKESHI·Filed 2008·Granted Oct 30, 2012·4 cites·6 claims
- 1059US9297631B2Spherical-form measuring apparatusMITUTOYO CORP·Filed 2013·Granted Mar 29, 2016·1 cites·5 claims
- 1159US8841638B2Particle beam therapy systemHAGINO TAKESHI·Filed 2011·Granted Sep 23, 2014·2 cites·6 claims
- 1258US12392605B2Method of estimating uncertainty of coordinate measurementMITUTOYO CORP·Filed 2022·Granted Aug 19, 2025·0 cites·4 claims
- 1352US12426304B2Semiconductor device and method of manufacturing the sameDENSO CORP·Filed 2023·Granted Sep 23, 2025·0 cites·7 claims
- 1450US12464768B2Vertical semiconductor swiching elements with sense cell regionDENSO CORP·Filed 2022·Granted Nov 4, 2025·0 cites·5 claims
- 1548US2025261439A1Vertical semiconductor deviceDENSO CORP·Filed 2025·Application pending·0 cites
- 1647US11923452B2Semiconductor device having semiconductor switching element in sense cell regionDENSO CORP·Filed 2021·Granted Mar 5, 2024·0 cites·5 claims
- 1746US10969355B2Measuring device for coefficient of thermal expansion and measurement method for coefficient of thermal expansionMITUTOYO CORP·Filed 2018·Granted Apr 6, 2021·0 cites·9 claims
- 1846US10900917B2Measuring device for coefficient of thermal expansion and measurement method for coefficient of thermal expansionMITUTOYO CORP·Filed 2018·Granted Jan 26, 2021·0 cites·8 claims
- 1943US11530908B2Measurement point determination method, non-transitory storage medium, and measurement point determination apparatusMITUTOYO CORP·Filed 2019·Granted Dec 20, 2022·0 cites·8 claims
- 2036US10444008B2Spherical shape measurement method and apparatus for rotating a sphere about first rotation axis and rotating a sphere hold mechanism about second rotation axis orthogonal to first rotation axisMITUTOYO CORP·Filed 2015·Granted Oct 15, 2019·0 cites·11 claims
- 2129US9180313B2Range shifter and particle radiotherapy deviceYAMAMOTO HIROHIDE·Filed 2012·Granted Nov 10, 2015·0 cites·8 claims
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