Inventor · disambiguated record
Min-Chung Chou
Also filed as: CHOU MIN CHUNG
34 granted patents·1 pending application·185 citations·filing 2000–2024
96Inventor score
Files withELITE SEMICONDUCTOR ESMT13CHOU MIN CHUNG10ELITE SEMICONDUCTOR MEMORY TECH INC4SUNPLUS TECHNOLOGY CO LTD4ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC1
Top patents by PatentIndex Score
35 records- 0194US9859894B1Level shifting circuit and integrated circuitELITE SEMICONDUCTOR MEMORY TECH INC·Filed 2017·Granted Jan 2, 2018·12 cites·18 claims
- 0289US8169851B2Memory device with pseudo double clock signals and the method using the sameCHOU MIN CHUNG·Filed 2010·Granted May 1, 2012·14 cites·12 claims
- 0387US7432758B2Voltage regulator for semiconductor memoryELITE SEMICONDUCTOR ESMT·Filed 2006·Granted Oct 7, 2008·19 cites·10 claims
- 0486US8081530B2Semiconductor memory device and associated local sense amplifierCHOU MIN CHUNG·Filed 2010·Granted Dec 20, 2011·11 cites·19 claims
- 0586US7787536B2Adaptive equalizer apparatus with digital eye-opening monitor unit and method thereofSUNPLUS TECHNOLOGY CO LTD·Filed 2007·Granted Aug 31, 2010·14 cites·17 claims
- 0685US8269535B1Delay-locked loop and method of using the sameCHOU MIN-CHUNG·Filed 2011·Granted Sep 18, 2012·8 cites·7 claims
- 0783US8416005B2Multifunctional output drivers and multifunctional transmitters using the sameLUO YAN-BIN·Filed 2010·Granted Apr 9, 2013·6 cites·13 claims
- 0882US7358780B2Low voltage differential signal driver with high power supply rejection rationSUNPLUS TECHNOLOGY CO LTD·Filed 2005·Granted Apr 15, 2008·10 cites·8 claims
- 0980US7932764B2Delay circuit with constant time delay independent of temperature variationsELITE SEMICONDUCTOR ESMT·Filed 2007·Granted Apr 26, 2011·10 cites·14 claims
- 1079US7099224B2Memory device and method for burn-in testELITE SEMICONDUCTOR ESMT·Filed 2005·Granted Aug 29, 2006·10 cites·3 claims
- 1176US7577043B2Voltage regulator for semiconductor memoryELITE SEMICONDUCTOR ESMT·Filed 2007·Granted Aug 18, 2009·10 cites·17 claims
- 1273US8149907B2Adaptive equalization apparatus with equalization parameter setting adaptively adjusted according to edges of equalizer output monitored in real-time manner and related method thereofCHOU MIN-CHUNG·Filed 2009·Granted Apr 3, 2012·5 cites·10 claims
- 1372US9479169B1Control circuit applied in e-fuse system and related methodELITE SEMICONDUCTOR MEMORY TECH INC·Filed 2015·Granted Oct 25, 2016·3 cites·17 claims
- 1471US7106644B2Memory device and method for burn-in testELITE SEMICONDUCTOR ESMT·Filed 2003·Granted Sep 12, 2006·15 cites·21 claims
- 1569US7965121B2Multifunctional output drivers and multifunctional transmitters using the sameMEDIATEK INC·Filed 2008·Granted Jun 21, 2011·5 cites·16 claims
- 1664US7741889B2Phase locked loop with phase rotation for spreading spectrumSUNPLUS TECHNOLOGY CO LTD·Filed 2008·Granted Jun 22, 2010·5 cites·16 claims
- 1762US8368447B1Delay lock loop circuitELITE SEMICONDUCTOR ESMT·Filed 2011·Granted Feb 5, 2013·2 cites·13 claims
- 1862US6262919B1Pin to pin laser signature circuitELITE SEMICONDUCTOR ESMT·Filed 2000·Granted Jul 17, 2001·12 cites·11 claims
- 1960US12315583B1Repairable semiconductor memory deviceELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC·Filed 2024·Granted May 27, 2025·0 cites·10 claims
- 2059US8107307B2Memory device with data paths for outputting compressed dataCHOU MIN-CHUNG·Filed 2010·Granted Jan 31, 2012·2 cites·14 claims
- 2158US8427889B2Memory device and associated main word line and word line driving circuitCHOU MIN CHUNG·Filed 2010·Granted Apr 23, 2013·2 cites·4 claims
- 2252US10642671B2Testing apparatus and folded probe card testing systemELITE SEMICONDUCTOR MEMORY TECH INC·Filed 2018·Granted May 5, 2020·0 cites·12 claims
- 2352US9229059B2Memory test system and methodELITE SEMICONDUCTOR ESMT·Filed 2013·Granted Jan 5, 2016·0 cites·5 claims
- 2452US8462571B2DRAM and method for testing the same in the wafer level burn-in test modeCHOU MIN-CHUNG·Filed 2011·Granted Jun 11, 2013·1 cites·9 claims
- 2552US6298003B1Boost circuit of DRAM with variable loadingELITE SEMICONDUCTOR ESMT·Filed 2001·Granted Oct 2, 2001·7 cites·17 claims
- 2650US6798802B2High-speed laser driver including wave-shaping circuitsIND TECH RES INST·Filed 2002·Granted Sep 28, 2004·2 cites·13 claims
- 2743US8743928B2Adaptive equalizer and operating method thereofCHOU MIN-CHUNG·Filed 2012·Granted Jun 3, 2014·0 cites·10 claims
- 2842US9118320B2Input buffer with current control mechanismELITE SEMICONDUCTOR ESMT·Filed 2013·Granted Aug 25, 2015·0 cites·11 claims
- 2941US7840194B2Transmitting circuit, receiving circuit, interface switching module and interface switching method for SATA and SAS interfacesSUNPLUS TECHNOLOGY CO LTD·Filed 2006·Granted Nov 23, 2010·0 cites·24 claims
- 3039US8018262B1Duty cycle correction circuitELITE SEMICONDUCTOR ESMT·Filed 2010·Granted Sep 13, 2011·0 cites·16 claims
- 3138US8296611B2Test circuit for input/output array and method and storage device thereofCHOU MIN-CHUNG·Filed 2010·Granted Oct 23, 2012·0 cites·15 claims
- 3237US9997230B1Reference voltage pre-processing circuit and reference voltage pre-processing method for a reference voltage bufferELITE SEMICONDUCTOR MEMORY TECH INC·Filed 2017·Granted Jun 12, 2018·0 cites·8 claims
- 3337US7253666B2Clock frequency divider circuit and method of dividing clock frequencyELITE SEMICONDUCTOR ESMT·Filed 2005·Granted Aug 7, 2007·0 cites·20 claims
- 3434US8238139B2Dynamic random access memory and method of driving dynamic random access memoryCHOU MIN-CHUNG·Filed 2010·Granted Aug 7, 2012·0 cites·8 claims
- 3533US2011228620A1Testing method for semiconductor memory deviceELITE SEMICONDUCTOR ESMT·Filed 2010·Application pending·0 cites
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