Inventor · disambiguated record
Hee-Soo Pyun
Also filed as: PYUN HEE-SOO
1 granted patent·2 pending applications·2 citations·filing 2006–2007
19Inventor score
Top patents by PatentIndex Score
3 records- 0167US7446555B2Apparatus to inspect TFT substrate and method of inspecting TFT substrateSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 4, 2008·2 cites·21 claims
- 0244US2008149830A1Ameliorating charge trap in inspecting samples using scanning electron microscopeSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 0330US2007153262A1Inspecting apparatus and methodBAEK DONG-SEOK·Filed 2006·Application pending·0 cites
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