Inventor · disambiguated record
Toshimi Ohsawa
Also filed as: OHSAWA TOSHIMI
7 granted patents·245 citations·filing 1994–2006
88Inventor score
Files withADVANTEST CORP7
Top patents by PatentIndex Score
7 records- 0187US5646948AApparatus for concurrently testing a plurality of semiconductor memories in parallelADVANTEST CORP·Filed 1994·Granted Jul 8, 1997·81 cites·15 claims
- 0279US5644578AFailure memory deviceADVANTEST CORP·Filed 1996·Granted Jul 1, 1997·50 cites·2 claims
- 0372US7441166B2Testing apparatus and testing methodADVANTEST CORP·Filed 2006·Granted Oct 21, 2008·9 cites·15 claims
- 0468US5673271AHigh speed pattern generatorADVANTEST CORP·Filed 1995·Granted Sep 30, 1997·32 cites·5 claims
- 0558US6513138B1Pattern generator for semiconductor test systemADVANTEST CORP·Filed 1999·Granted Jan 28, 2003·22 cites·15 claims
- 0658US5717694AFail analysis device for semiconductor memory test systemADVANTEST CORP·Filed 1996·Granted Feb 10, 1998·38 cites·6 claims
- 0748US5682393APattern generator for cycle delayADVANTEST CORP·Filed 1995·Granted Oct 28, 1997·13 cites·4 claims
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