Inventor · disambiguated record
Hyun-Beom Shin
Also filed as: SHIN HYUN-BEOM
2 granted patents·7 citations·filing 2004–2005
53Inventor score
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2 records- 0166US7348190B2Method of detecting a defect in a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 25, 2008·3 cites·20 claims
- 0248US7385658B2Dual display mode liquid crystal display device, communication device using the same, and method of fabricating the sameLG PHILIPS LCD CO LTD·Filed 2004·Granted Jun 10, 2008·4 cites·42 claims
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