Inventor · disambiguated record
Hui-Yun Chao
Also filed as: CHAO HUI · CHAO HUI-YUN
9 granted patents·1 pending application·30 citations·filing 2010–2022
85Inventor score
Files withCHEN JUI-LONG4TAIWAN SEMICONDUCTOR MFG CO LTD3TAIWAN SEMICONDUCTOR MFG2HUAWEI TECH CO LTD1
Top patents by PatentIndex Score
10 records- 0188US10161965B2Method of test probe alignment controlTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Dec 25, 2018·6 cites·20 claims
- 0286US8627251B2Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processesCHEN JUI-LONG·Filed 2012·Granted Jan 7, 2014·7 cites·20 claims
- 0383US9165843B2Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Oct 20, 2015·3 cites·20 claims
- 0479US8938698B2Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processesTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jan 20, 2015·3 cites·19 claims
- 0577US8942840B2Auto device skew manufacturingTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jan 27, 2015·3 cites·20 claims
- 0673US8406912B2System and method for data mining and feature tracking for fab-wide prediction and controlCHEN JUI-LONG·Filed 2010·Granted Mar 26, 2013·3 cites·17 claims
- 0767US9000798B2Method of test probe alignment controlCHEN JUI-LONG·Filed 2012·Granted Apr 7, 2015·2 cites·20 claims
- 0866US8391999B2Auto device skew manufacturingCHEN JUI-LONG·Filed 2010·Granted Mar 5, 2013·2 cites·20 claims
- 0963US9158867B22D/3D analysis for abnormal tools and stages diagnosisTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted Oct 13, 2015·1 cites·18 claims
- 1045US2023020299A1Data recovery method and apparatusHUAWEI TECH CO LTD·Filed 2022·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →