Inventor · disambiguated record

Takashi Aikyo

Also filed as: AIKYO TAKASHI

1 granted patent·0 citations·filing 2008–2008

7Inventor score

Technology areasG01R

Files withSEMICONDUCTOR TECH ACAD RES CT1

Top patents by PatentIndex Score

1 record

0131US7983858B2Fault test apparatus and method for testing semiconductor device under test using fault excitation functionSEMICONDUCTOR TECH ACAD RES CT·Filed 2008·Granted Jul 19, 2011·0 cites·14 claims

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