Inventor · disambiguated record
Lee N. Chung
Also filed as: CHUNG LEE N · CHUNG LEE NI
4 granted patents·114 citations·filing 2005–2018
76Inventor score
Files withXILINX INC4
Top patents by PatentIndex Score
4 records- 0195US7302625B1Built-in self test (BIST) technology for testing field programmable gate arrays (FPGAs) using partial reconfigurationXILINX INC·Filed 2005·Granted Nov 27, 2007·79 cites·12 claims
- 0288US9091727B1Configuration and testing of multiple-die integrated circuitsXILINX INC·Filed 2012·Granted Jul 28, 2015·32 cites·19 claims
- 0376US10761137B1Flexible manufacturing flow enabled by adaptive binning systemXILINX INC·Filed 2018·Granted Sep 1, 2020·2 cites·20 claims
- 0444US8030954B1Internal voltage level shifting for screening cold or hot temperature defects using room temperature testingXILINX INC·Filed 2009·Granted Oct 4, 2011·1 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →