Inventor · disambiguated record
Victor Tikhonov
Also filed as: TIKHONOV VICTOR · TIKHONOV VICTOR B
10 granted patents·2 pending applications·207 citations·filing 1995–2023
89Inventor score
Top patents by PatentIndex Score
12 records- 0193US7489106B1Battery optimization system and method of useTIKHONOV VICTOR·Filed 2006·Granted Feb 10, 2009·141 cites·5 claims
- 0270US6279889B1Loose die fixtureLSI LOGIC CORP·Filed 2000·Granted Aug 28, 2001·15 cites·20 claims
- 0367US6936230B2System for thermal and catalytic cracking of crude oilFiled 2000·Granted Aug 30, 2005·11 cites·9 claims
- 0457US2025170895A1Intelligent high voltage interlock loop with individualized detection of connector connectivityFISKER INC·Filed 2023·Application pending·0 cites
- 0554US11764503B2PCB external device connectorTIKHONOV VICTOR·Filed 2021·Granted Sep 19, 2023·0 cites·2 claims
- 0653US5952838AReconfigurable array of test structures and method for testing an array of test structuresSONY CORP·Filed 1996·Granted Sep 14, 1999·18 cites·16 claims
- 0746US11904177B2Pocket-sized automated external defibrillatorUSA MEDICAL ELECTRONIX INC·Filed 2022·Granted Feb 20, 2024·0 cites·20 claims
- 0842US2003070984A1Vortex devices with maximum efficiency nozzleFiled 2002·Application pending·0 cites
- 0940US5741732AMethod for detecting implantation mask misalignmentSONY CORP·Filed 1995·Granted Apr 21, 1998·9 cites·18 claims
- 1036US6033994AApparatus and method for deprocessing a multi-layer semiconductor deviceSONY CORP·Filed 1997·Granted Mar 7, 2000·6 cites·14 claims
- 1134US5967889AFixture for mechanical grinding and inspection of failed or defective semiconductor devicesSONY CORP·Filed 1997·Granted Oct 19, 1999·4 cites·17 claims
- 1233US6135860AFixture for mechanical grinding and inspection of failed or defective semiconductor devicesSONY CORP·Filed 1999·Granted Oct 24, 2000·3 cites·14 claims
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