Inventor · disambiguated record
Oden Lee Warren
Also filed as: WARREN ODEN · WARREN ODEN L · WARREN ODEN LEE
15 granted patents·4 pending applications·175 citations·filing 1998–2015
93Inventor score
Top patents by PatentIndex Score
19 records- 0195US8959980B2Nanomechanical testing systemHYSITRON INC·Filed 2013·Granted Feb 24, 2015·21 cites·10 claims
- 0294US8161803B2Micromachined comb drive for quantitative nanoindentationOH YUNJE·Filed 2009·Granted Apr 24, 2012·26 cites·23 claims
- 0392US8844366B2Three dimensional transducerWARREN ODEN LEE·Filed 2012·Granted Sep 30, 2014·28 cites·20 claims
- 0492US8770036B2Nanomechanical testing systemHYSITRON INC·Filed 2013·Granted Jul 8, 2014·11 cites·20 claims
- 0591US7798011B2Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopyHYSITRON INC·Filed 2007·Granted Sep 21, 2010·27 cites·32 claims
- 0690US9759641B2Micro electro-mechanical heaterHYSITRON INC·Filed 2015·Granted Sep 12, 2017·4 cites·23 claims
- 0789US8453498B2Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopyWARREN ODEN L·Filed 2010·Granted Jun 4, 2013·13 cites·27 claims
- 0889US7425698B2Feedback influenced increased-quality-factor scanning probe microscopeWARREN ODEN L·Filed 2006·Granted Sep 16, 2008·14 cites·32 claims
- 0986US9316569B2Micro electro-mechanical heaterOH YUNJE·Filed 2010·Granted Apr 19, 2016·6 cites·44 claims
- 1085US9157845B22-D MEMS tribometer with comb drivesOH YUNJE·Filed 2011·Granted Oct 13, 2015·7 cites·15 claims
- 1184US9304072B2Micromachined comb drive for quantitative nanoindentationOH YUNJE·Filed 2012·Granted Apr 5, 2016·5 cites·21 claims
- 1282US8939041B2Nanomechanical testing systemVODNICK DAVID JAMES·Filed 2012·Granted Jan 27, 2015·6 cites·20 claims
- 1368US9804072B2High temperature heating systemHYSITRON INC·Filed 2012·Granted Oct 31, 2017·1 cites·21 claims
- 1462US8738315B2Digital damping control of nanomechanical test instrumentsOH YUNJE·Filed 2009·Granted May 27, 2014·3 cites·24 claims
- 1561US9404841B2Microelectromechanical transducer and test systemHYSITRON INCORPORATED·Filed 2012·Granted Aug 2, 2016·3 cites·48 claims
- 1643US2006027739A1Scanning probe microscope and methodWARREN ODEN L·Filed 2005·Application pending·0 cites
- 1741US2004065821A1Intermittent contact imaging under force-feedback controlFiled 2003·Application pending·0 cites
- 1839US2003042409A1Intermittent contact imaging under force-feedback controlFiled 2002·Application pending·0 cites
- 1930US2001013574A1Intermittent contact imaging under force-feedback controlFiled 1998·Application pending·0 cites
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